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X-ray diffraction residual stress measurement

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Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003528
EISBN: 978-1-62708-180-1
... Abstract This article focuses primarily on what an analyst should know about applying X-ray diffraction (XRD) residual stress measurement techniques to failure analysis. Discussions are extended to the description of ways in which XRD can be applied to the characterization of residual stresses...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006768
EISBN: 978-1-62708-295-2
... Definition of the reference axes and the direction of measurement in x-ray diffraction residual-stress analysis Fig. 3 ψ-splitting on steel using (a) elliptical fit and (b) linear fit for ψ > 0 and ψ < 0 Fig. 2 Common types of d -spacing versus sin 2 ψ plots. (a) Linear: exhibiting...
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Published: 15 December 2019
Fig. 1 Principles of x-ray diffraction residual-stress measurement. D, x-ray detector; S, x-ray source; N , normal to the surface. (a) Ψ = 0: Poisson’s ratio contraction of lattice spacing. (b) Ψ > 0: Tensile extension of lattice planes by stress σ More
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001761
EISBN: 978-1-62708-178-8
... Abstract In x-ray diffraction residual stress measurement, the strain in the crystal lattice is measured, and the residual stress producing the strain is calculated, assuming a linear elastic distortion of the crystal lattice. This article provides a detailed account of the plane stress elastic...
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Published: 01 November 2010
Fig. 14 Residual stresses in the tool axis direction. X-ray diffraction measurements; Ti 6-4 sample 90° orientation. Values less than zero indicate compressive residual stress and values greater than zero indicate tensile residual stress. More
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Published: 15 December 2019
Fig. 4 Basic geometry of the single-angle technique for x-ray diffraction residual-stress measurement. β, angle of inclination of the instrument; 0, point at which a cone of diffracted radiation originates; 1 and 2, points of the diffracting crystals; S 1 and S 2 , the arc lengths along More
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Published: 01 January 1986
Fig. 4 Basic geometry of the single-angle technique for x-ray diffraction residual stress measurement. N p , normal to the lattice planes; N s , normal to the surface. See text for a discussion of other symbols. Source: Ref 2 More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006632
EISBN: 978-1-62708-213-6
... Abstract This article provides a detailed account of x-ray diffraction (XRD) residual-stress techniques. It begins by describing the principles of XRD stress measurement, followed by a discussion on the most common methods of XRD residual-stress measurement. Some of the procedures required...
Series: ASM Handbook
Volume: 8
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.hb.v08.a0003329
EISBN: 978-1-62708-176-4
... the semidestructive methods of residual stress measurement: blind hole drilling and ring coring, spot annealing, and X-ray diffraction techniques. Nondestructive methods such as neutron diffraction, ultrasonic velocity, and magnetic Barkhausen noise techniques, are also discussed. Barkhausen noise analysis...
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Published: 01 January 1994
Fig. 4 Measurement and analysis of surface damage using x-ray diffraction. (a) 38 mm (1.5 in.) 1018 steel cutoff sample showing burn-related discoloration. Two residual stress measurements by x-ray diffraction were made on the sample at the locations marked by the four concentric markers. (b More
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003251
EISBN: 978-1-62708-199-3
... with the greatest care Sample Requirements Identical to those indicated above for routine diffractometer examination Measurement of Residual Stresses X-ray residual stress measurement is substantially more complex, but its key principles are not difficult to understand. Residual stresses...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001298
EISBN: 978-1-62708-170-2
... Abstract This article provides a useful guide for measuring residual macrostress on coatings. The most commonly used measurement methods are mechanical deflection, X-ray diffraction, and hole-drilling strain-gage. After a discussion on the origins of residual stress, the article describes...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001765
EISBN: 978-1-62708-178-8
... states in crystalline materials. The technique is based on x-ray methodology, which is discussed in the article “X-Ray Diffraction Residual Stress Techniques” in this Volume. However, differences in types of applications and experimental procedures arise due to differences in beam penetration, peak...
Series: ASM Handbook
Volume: 8
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.hb.v08.a0003325
EISBN: 978-1-62708-176-4
... by the residual stress. These techniques include x-ray diffraction, neutron diffraction, Barkhausen noise analysis, and ultrasonic propagation analysis. Both groups of techniques do not measure stress directly. Both measure strain. Both groups have limitations for measuring rapidly varying residual stress...
Series: ASM Handbook
Volume: 5
Publisher: ASM International
Published: 01 January 1994
DOI: 10.31399/asm.hb.v05.a0001238
EISBN: 978-1-62708-170-2
.... 4 Measurement and analysis of surface damage using x-ray diffraction. (a) 38 mm (1.5 in.) 1018 steel cutoff sample showing burn-related discoloration. Two residual stress measurements by x-ray diffraction were made on the sample at the locations marked by the four concentric markers. (b) Typical...
Series: ASM Handbook
Volume: 19
Publisher: ASM International
Published: 01 January 1996
DOI: 10.31399/asm.hb.v19.a0002363
EISBN: 978-1-62708-193-1
... force microscopy, and scanning acoustic microscopy. The article also reviews the X-ray diffraction technique used for determining the compositional changes, strain changes, and residual stress evaluation during the fatigue process. acoustic emission technique atomic force microscopy crack growth...
Image
Published: 01 August 2018
Fig. 6 Example of correlation between maximum subsurface residual stress (in the axial direction) and magnetic Barkhausen noise signal amplitude. Residual-stress measurements performed via x-ray diffraction and electrochemical layer removal. Courtesy of American Stress Technologies, Inc. More
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.a0001475
EISBN: 978-1-62708-173-3
... and classifies them as follows: Stress-relaxation techniques X-ray diffraction techniques Techniques using stress-sensitive properties Cracking techniques Classification of techniques for measuring residual stress Table 1 Classification of techniques for measuring residual stress...
Series: ASM Handbook
Volume: 4E
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.hb.v04e.a0006252
EISBN: 978-1-62708-169-6
.... The surface residual stresses, as measured using x-ray diffraction, were effectively zero or slightly tensile in a 2 mm (0.08 in.) thick specimen (assumed to be caused by bending and distortion in the sample), decreasing rapidly to approximately −220 MPa (−32 ksi) in a 50 mm (2 in.) thick specimen...
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Published: 15 January 2021
Fig. 1 Definition of the reference axes and the direction of measurement in x-ray diffraction residual-stress analysis More