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X-ray absorption spectroscopy

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Image
Published: 15 May 2022
Fig. 5 Typical energy-dispersive x-ray spectroscopy spectrum showing absorption features indicative of unique elements and the quantitation of those elements. cps, counts per second More
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... spectroscopy, Auger electron spectroscopy, X-ray photoelectron spectroscopy, ion scattering spectroscopy, reflectance Fourier transform infrared absorption spectroscopy, Raman and surface enhanced Raman spectroscopy, and extended X-ray absorption fine structure analysis. corrosion corrosion inhibition...
Book Chapter

By S. Lampman
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006645
EISBN: 978-1-62708-213-6
... and processes involved in sample preparation for XRF analysis are also included. The article further provides information on the practical procedure for and the applications of WDS and EDS qualitative and quantitative analyses. X-ray absorption X-ray emission X-ray spectroscopy X-Ray Radiation X-ray...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
..., such as X-ray powder diffraction, inductively coupled plasma atomic emission spectroscopy, atomic absorption spectroscopy, and atomic fluorescence spectrometry, are also discussed. atomic absorption spectroscopy atomic fluorescence spectrometry Auger electron spectroscopy bulk analysis electron...
Image
Published: 15 December 2019
Fig. 1 Flow charts of common techniques for characterization of glasses and ceramics. AAS, atomic absorption spectrometry; AES, Auger electron spectroscopy; EPMA, electron probe x-ray microanalysis; FTIR, Fourier transform infrared spectroscopy; IA, image analysis; IC, ion chromatography; ICP More
Image
Published: 15 December 2019
electron microscopy; SIMS: secondary ion mass spectroscopy; TEM: transmission electron microscopy; UV/VIS: ultraviolet/visible absorption spectroscopy; XPS: x-ray photoelectron spectroscopy; XRD: x-ray diffraction; XRS: x-ray spectrometry. (a) Limited number of elements or groups. (b) Volatile liquids More
Image
Published: 15 December 2019
spectroscopy; TEM: transmission electron microscopy; UV/VIS: ultraviolet/visible absorption spectroscopy; XPS: x-ray photoelectron spectroscopy; XRD: x-ray diffraction; XRS: x-ray spectrometry. (a) Limited number of elements or groups. (b) Volatile liquids, solids, or components. (c) Under special conditions More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006665
EISBN: 978-1-62708-213-6
... Abstract This article provides a detailed account of extended x-ray absorption fine structure (EXAFS). It begins with a description of the fundamentals of EXAFS, providing information on the physical mechanism, single-scattering approximation, and multiple-scattering effects. This is followed...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... ESCA electron spectroscopy for chemical analysis ESR electron spin resonance EXAFS extended x-ray absorption fine structure FIM field ion microscopy FNAA fast neutron activation analysis FMR ferromagnetic resonance FT-IR Fourier transform infrared...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... • … • … • … … • … … … … … • … Transmission electron microscopy S … C … N N … … • … N N … C • Ultraviolet/visible absorption spectroscopy D, • D, • D,• … D,• D,• D,• D,• … … D,• D,• D,• … … X-ray diffraction … … C … C C C,S C … … C C … C … X-ray photoelectron spectroscopy • N S...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001733
EISBN: 978-1-62708-178-8
.... electromagnetic radiation energy-dispersive X-ray spectrometers qualitative analysis quantitative analysis sample preparation X-ray absorption spectroscopy X-ray emission spectroscopy Overview Introduction X-ray spectrometry, or x-ray fluorescence, is an emission spectroscopic technique that has...
Image
Published: 15 December 2019
absorption spectroscopy; XRS: x-ray spectrometry. (a) Limited number of elements or groups. (b) Volatile liquids, solids, or components More
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003250
EISBN: 978-1-62708-199-3
... Abstract The overall chemical composition of metals and alloys is most commonly determined by X-ray fluorescence (XRF) and optical emission spectroscopy (OES), and combustion and inert gas fusion analysis. This article provides information on the capabilities, uses, detection threshold...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005692
EISBN: 978-1-62708-178-8
... shows an enlarged image of photographic plates. emulsion. the tip, and individual atoms are made visible. See also atom probe. emission spectroscopy. The branch of spec- extended x-ray absorption fine structure troscopy treating the theory, interpreta- (EXAFS). The weak oscillatory structure field...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... of the absorbing substance. See also occurring isotopes weighted by the relative weight of any substance. See also gram- absorptivity. proportions of those isotopes. molecular weight and mole. beryllium window. A very thin (~7.5 mm atomization. The subdivision of a compound B thick), relatively x-ray-transparent...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... metallography; RS, Raman spectroscopy; SAXS, small-angle x-ray scattering; SEM, scanning electron microscopy; SIMS, secondary ion mass spectroscopy; TEM, transmission electron microscopy; UV/VIS, ultraviolet/visible absorption spectroscopy; XPS, x-ray photoelectron spectroscopy; XRD, x-ray diffraction; XRS, x...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... Abstract X-ray spectroscopy is generally accepted as the most useful ancillary technique that can be added to any scanning electron microscope (SEM), even to the point of being considered a necessity by most operators. While “stand-alone” x-ray detection systems are used less frequently...
Series: ASM Handbook
Volume: 5A
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.hb.v05a.a0005731
EISBN: 978-1-62708-171-9
..., and atomic absorption spectrometry are also discussed. chemical methods crystal structure particle size powder testing sieve method thermal spray coating X-ray diffraction THE RAW MATERIALS used in thermal spray processes are a critical parameter in the finished coating. Lot-to-lot...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... absorption spectrometry D … … … … D D … … D D D … … … Auger electron spectroscopy ● … … ● ● … … ● ● ● ● S … … S Electron probe x-ray microanalysis ● … … ● ● ● … ● … ● ● S S … ● Image analysis … … … … … … ● ● … … … … … … ● Ion...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
.... These methods include light microscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive X-ray spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy. atomic force...