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SEM/EDS fracture surface analysis

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Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
... available for in situ fracture studies and have application in the kinematic analysis of deformation. These features make SEM an ideal tool for the study of fracture surfaces. Different fracture modes exhibit unique features that are easily documented by SEM. This article will discuss the basic...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... scanning electron microscopy with EDS. When SEM microscale chemical analysis is to be performed on small amounts of material removed from a fracture surface, the preferred method for sampling is to use microscopy tape to pick up the contaminant directly on a conductive substrate. Alternatively, when...
Book: Casting
Series: ASM Handbook
Volume: 15
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.hb.v15.a0005343
EISBN: 978-1-62708-187-0
... fracture features and the presence of oxides. Scanning Electron Microscopy (SEM) Examination of the apparent fracture origin with SEM confirmed the presence of nonmetallic material and porosity, as shown in Fig. 3 . Inspection of the fracture surface at the origin region showed the presence...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... cannot be performed. Residue from adhesive tapes also adds substantial artifact contamination to a surface, which can confound the failure analysis when the chemical nature of the surface is important. Fig. 7 (a) SEM image and (b) EDS spectrum (10 kV) for fingerprint residue on a clean steel...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001837
EISBN: 978-1-62708-181-8
... relationships to be set up for features in the fracture surface (see the section “Analytical Procedures” in this article for a discussion of roughness parameters). Errors of over 100% are found when values of dimple size or facet size are calculated directly from the scanning electron microscopy (SEM...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003542
EISBN: 978-1-62708-180-1
... the edge of the fracture surface. There seems to be extensive surface damage along this edge, but it is not seen clearly. The higher-magnification SEM image in Fig. 2 , taken at the right side of the origin region, reveals details of the contact damage on the surface. This image leaves no doubt...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003536
EISBN: 978-1-62708-180-1
... 39 , 40 , 41 , 42 , 43 , 44 , 45 , 46 , 47 ). Modern image processing techniques permit reconstruction of the 3D fracture surface and its quantitative characterization using stereo-pair SEM data in an efficient manner ( Ref 41 , 42 , 43 ). The basic image analysis techniques are described...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... a rough surface so that more accurate quantitative information can be obtained from the particles using x-ray analysis. Fig. 9 Schematic showing method for producing extraction replicas and surface replicas for SEM examination New liquid epoxy resins are also available for making surface...
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006836
EISBN: 978-1-62708-329-4
... spring failed prematurely at the location of the defect, despite all other parameters being normal. Fig. 2 (a) Fatigue fracture surface of a coil spring that failed prematurely due to a subsurface inclusion; (b) as shown with SEM imaging Fig. 3 EDS results showing the inclusion...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003539
EISBN: 978-1-62708-180-1
.... Quenched-and-tempered medium-carbon alloy steel tested in rotating bending, imaged using a SEM Fig. 38 SEM view of fatigue fracture surface of annealed medium-carbon alloy steel tested in rotating bending. No distinct fatigue striations could be resolved. Crack growth direction from right to left...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
...-lithium detectors obsolete for EDS analysis on SEM systems. Fig. 3 Schematic of a silicon-drift detector (SDD) system. EDS, energy-dispersive spectrometer Wavelength-Dispersive Spectrometers Spectrometers that characterize x-rays based on their wavelength offer better results than EDS...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003058
EISBN: 978-1-62708-200-6
... electron microscope (SEM), transmission electron microscope (TEM). Not all of these steps will be necessary for every examination. Sometimes specialized techniques, such as replicating fracture surfaces or applying a reflecting coating, need to be employed. Figure 2 shows the major steps for conducting...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005657
EISBN: 978-1-62708-198-6
... may include visual, optical microscopy, x-ray, scanning electron microscopy (SEM), energy-dispersive spectroscopy, surface interferometry, or other techniques that do not cause permanent changes to the device. Nondestructive examination may also include dimensional analysis of the device...
Series: ASM Handbook
Volume: 1A
Publisher: ASM International
Published: 31 August 2017
DOI: 10.31399/asm.hb.v01a.a0006323
EISBN: 978-1-62708-179-5
..., the predominant fracture mechanisms can be revealed by specific characteristic features on the fracture surface ( Ref 1 , 2 , 3 , 4 ). The fracture surface must be examined macro- and microscopically. Since its development, scanning electronic microscopy (SEM) has been applied to the fractographic analysis...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... analysis. Fig. 9 Schematic showing method for producing extraction replicas and surface replicas for scanning electron microscope examination Liquid epoxy resins, acrylic resins, and silicone compounds are also available for making surface replicas for SEM investigations; a small portion...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003554
EISBN: 978-1-62708-180-1
... analytical techniques, such as Auger electron spectroscopy or electron spectroscopy for chemical analysis. Liquid metal induced embrittlement fractures are not very easy to examine in the SEM. Removal of the coating of resolidified metal on the fracture surface is required, and this process may damage...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
.... It is normally used after examination has been made using a light optical microscope. Size limitations of the chamber of the SEM often dictate sectioning of the subject component prior to examination. Microfractography Detailed examination of fracture surfaces at higher magnification can facilitate...
Series: ASM Handbook
Volume: 15
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.hb.v15.9781627081870
EISBN: 978-1-62708-187-0
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... was not thoroughly removed. The depth resolution for EDS analysis depends on the accelerating voltage of the SEM and the average atomic weight of the analyzed sample. For heavy elements and low accelerating voltage, the analysis depth can be as little as approximately 1 μm. For typical accelerating voltages...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006786
EISBN: 978-1-62708-295-2
... techniques, such as Auger electron spectroscopy (AES), electron spectroscopy for chemical analysis (ESCA), or x-ray photoelectron spectroscopy (XPS). Evaluation of the embrittled material surface is not very easy to do in the SEM. Removal of the coating of resolidified metal on the fracture surface...