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SEM/EDS analysis

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Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
...-lithium detectors obsolete for EDS analysis on SEM systems. Fig. 3 Schematic of a silicon-drift detector (SDD) system. EDS, energy-dispersive spectrometer Wavelength-Dispersive Spectrometers Spectrometers that characterize x-rays based on their wavelength offer better results than EDS...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... The EDS feature of a scanning electron microscope is an even more powerful tool for microchemical analysis work. The EDS method works when electrons from the SEM analyzing beam knock electrons out of their orbits around the atom. Electrons that are in higher-energy orbitals have a tendency to fill...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... analysis, the fractographic features of a part need to be analyzed at the micron scale in an SEM to determine the failure mechanism. If the subject part is small enough to fit in the chamber of the SEM, direct chemical analysis via EDS or WDS is desirable as part of the fractographic analysis. With EDS...
Image
Published: 01 January 2002
Fig. 45 SEM backscattered electron image of area within Fig. 44 , showing points identified for detailed EDS analysis More
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001835
EISBN: 978-1-62708-181-8
... to that element. Fig. 4 Origin of x-rays as shown in the Bohr model of the atom Energy-Dispersive Spectroscopy (EDS) Energy-dispersive spectroscopy (EDS) is the more common method of x-ray analysis used in SEM. The conventional system can quantitatively analyze elements with Z exceeding...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... chromatography; LC/MS: liquid chromatography/mass spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... with a scanning electron microscope (SEM). During the SEM examination any surface structure of interest can be analyzed for elemental identity and elemental composition; the EDS technique can identify elements with atomic numbers greater than 5 (boron). The principle of the technique involves the analysis...
Book Chapter

By Bo Hu
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006102
EISBN: 978-1-62708-175-7
... if it is equipped with an energy-dispersive x-ray spectrometer (EDS). Compared to optical scopes, the SEM provides high-resolution images and can present the details of particle morphology ( Fig. 1 ). This article provides brief examples of particle image analysis on metal powders used in the PM industry. Fig...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
... was not thoroughly removed. The depth resolution for EDS analysis depends on the accelerating voltage of the SEM and the average atomic weight of the analyzed sample. For heavy elements and low accelerating voltage, the analysis depth can be as little as approximately 1 μm. For typical accelerating voltages...
Image
Published: 15 December 2019
: liquid chromatography/mass spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning More
Book: Casting
Series: ASM Handbook
Volume: 15
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.hb.v15.a0005343
EISBN: 978-1-62708-187-0
... involves examination of the part at magnifications up to 10,000× or higher, typically using a scanning electron microscope (SEM). The critical features found during visual examination should be studied at high magnification. It is most important that the features at the origin(s) be examined. The shape...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003252
EISBN: 978-1-62708-199-3
... analysis have difficulty detecting and analyzing elements with atomic numbers less than ∼7 (nitrogen); older instruments with beryllium window detector cannot detect elements with atomic numbers lower than ∼11 (sodium). Sample Requirements Sample size up to ∼5 cm can be accommodated by most SEMs...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... information from a sample. Thus, the analytical capabilities of an SEM cover a wide range of information, and accessories can be chosen to suit the particular interests of the user. Scanning electron microscopes have been found particularly useful in failure analysis investigations. This is true...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
... of an SEM contains the sample and the primary detectors for imaging and analysis. Specimen chambers range in size from small enclosures used for tabletop SEMs housing centimeter-sized samples, to medium-range sizes typical for research-grade SEMs capable of handling up to ~20 cm (8 in.) samples, to large...
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006126
EISBN: 978-1-62708-175-7
... of metal powders, surface analysis should be approached with great care. Typically, microfocus electron beam techniques are the only solution for this. Scanning electron microscopy (SEM) using a microscope equipped with an energy-dispersive spectroscopy (EDS) system can provide qualitative analysis...
Series: ASM Handbook
Volume: 12
Publisher: ASM International
Published: 01 January 1987
DOI: 10.31399/asm.hb.v12.a0001837
EISBN: 978-1-62708-181-8
... surface. An additional degree of freedom, such as that provided by stereometry or profile analysis, is necessary to generalize the three-dimensional spatial analysis. Single SEM Fractograph Limited information can be obtained from the flat TEM or SEM picture. Basically, in a two-dimensional surface...
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006836
EISBN: 978-1-62708-329-4
... the location of a fatigue crack on the cross section of a spring that initiated approximately 1 mm subsurface due to a large inclusion particle. Figure 2(b) shows the fracture with SEM imaging. The EDS mapping scans in Fig. 3 reveal that the inclusion is rich in aluminum and magnesium. This particular coil...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003539
EISBN: 978-1-62708-180-1
... since the 1950s, and scanning electron microscopes (SEMs) have been commercially available for more than 35 years ( Ref 22 ). Today, the SEM is standard equipment for any laboratory performing failure analysis and fractography. The SEM offers significantly superior resolution and depth of field compared...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006649
EISBN: 978-1-62708-213-6
... is a nondestructive technique, while the latter is required to dissolve the powder in an aggressive solution. Today (2019), an SEM equipped with an EDS is a quick and convenient tool as a dry analysis method for determining the elemental compositions of a powder. Although it is not an accurate analysis for chemical...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005657
EISBN: 978-1-62708-198-6
... may include visual, optical microscopy, x-ray, scanning electron microscopy (SEM), energy-dispersive spectroscopy, surface interferometry, or other techniques that do not cause permanent changes to the device. Nondestructive examination may also include dimensional analysis of the device...