Skip Nav Destination
Close Modal
By
Wenqian Xu, Saul H. Lapidus, Andrey Y. Yakovenko, Youngchang Kim, Olaf J. Borkiewicz ...
Search Results for
Rietveld refinement
Update search
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
Filter
- Title
- Authors
- Author Affiliations
- Full Text
- Abstract
- Keywords
- DOI
- ISBN
- EISBN
- Issue
- ISSN
- EISSN
- Volume
- References
NARROW
Format
Topics
Book Series
Date
Availability
1-8 of 8 Search Results for
Rietveld refinement
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
... line extinction (difficult), refinement Powder Arrangement of atoms Automatic: direct methods, solution and refinement of intensities Single crystal Global optimization, direct, real space and hybrid methods, Rietveld refinement of whole pattern Powder Identification of compound...
Abstract
This article describes the methods of X-ray diffraction analysis, the types of information that can be obtained, and its interpretation. The discussion covers the basic theories of X-rays and various types of diffraction experiments, namely single-crystal methods for polychromatic and monochromatic beams, powder diffraction methods, and the Rietveld method.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006667
EISBN: 978-1-62708-213-6
..., “real space” methods FULLPROF 42 https://www.ill.eu/sites/fullprof/ Rietveld refinement—nuclear and magnetic structure; single-crystal refinement GSAS/EXPGUI 66, 67 https://subversion.xray.aps.anl.gov/trac/EXPGUI Rietveld refinement; single-crystal refinement GSAS-II 68 https...
Abstract
This article provides a brief introduction to neutron diffraction as well as its state-of-the-art capabilities. The discussion covers the general principles of the neutron, neutron-scattering theory, generation of neutrons, types of incident radiation, and purposes of single-crystal neutron diffraction, powder diffraction, and pair distribution function analysis. The relationship between detector space and reciprocal space are presented. Various factors involved in sample preparation, calibration, and techniques used for analyzing diffraction data are described. The article also presents application examples and possible future developments in neutron diffraction.
Book Chapter
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006654
EISBN: 978-1-62708-213-6
... on the Bragg reflections, for example, Rietveld refinement. The PXRD data suitable for PDF analysis must have an extremely high signal-to-noise ratio and cover a broad range of Q , that is, Q max > 20 Å −1 , in order to achieve adequate resolution in the real space after Fourier transform...
Abstract
This article discusses the techniques and applications of synchrotron x-ray diffraction, providing information on x-ray generation, monochromation, and crystallography. X-ray diffraction techniques covered include single-crystal and powder diffraction. Some of the factors involved in the construction and development of macromolecular x-ray crystallography are also described.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006656
EISBN: 978-1-62708-213-6
... Cathode Ray Tube Cathode Assemblies Plastic Gears Polymer Films Qualitative Phase Identification Quantitative Analysis Rietveld Structure Refinement Stress/Texture Conventional Microsource When x-rays exit the window of the tube, the beam paths are divergent. Beam optics...
Abstract
This article discusses various concepts of micro x-ray diffraction (XRD) used for the examination of materials in situ. The discussion covers the principles, equipment used, sample preparation procedure, considerations for calibrating a detector, steps for performing data analysis, and applications and interpretation of micro-XRD.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001765
EISBN: 978-1-62708-178-8
..., increasingly it has been applied to the solution of structures by trial and error or Patterson methods. In addition to refinement of atomic coordinates and temperature factors, the original Rietveld code was established for the refinement of magnetic structures. Newer versions of the code can be used...
Abstract
Neutrons are a principal tool for the study of lattice vibrational spectra in materials. This article provides a detailed account of fission and spallation methods of neutron production that are capable of producing sufficient intensity to be useful in neutron scattering research. It describes the instrumentation required for, and advancements made in, neutron powder diffraction. The article further explains the texture and residual stress (macrostresses and microstresses) problems that are analyzed using the neutron powder diffraction method. It also outlines the single-crystal neutron diffraction technique, and provides examples of the applications of neutron diffraction.
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006680
EISBN: 978-1-62708-213-6
.... and Snyder R. , Introduction to X-Ray Powder Diffractometry , John Wiley , 1996 10.1002/9781118520994 17. Rietveld H.M. , A Profile Refinement Method for Nuclear and Magnetic Structures , J. Appl. Crystallogr. , Vol 2 , 1969 , p 65 10.1107/S0021889869006558 18. Young R.A...
Abstract
X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders, aggregates of finely divided material or polycrystalline specimens. This article provides a detailed account of XRPD. It begins with a discussion on XRPD instrumentation and the techniques used to characterize samples. The article then describes the principles, advantages, and disadvantages of various types of powder diffractometers. A section on the Rietveld method of diffraction analysis is then presented. The article discusses various methods and procedures for qualifying and quantifying phase mixtures in powder samples. It provides information on typical sensitivity and experimental limits on precision of XRPD analysis and other systematic sources of errors that affect accuracy. Some of the factors pertinent to the estimation of crystallite size and defects are also presented. The article ends with a few application examples of XRPD.
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003744
EISBN: 978-1-62708-177-1
... have also been proposed. One such analysis employs multiple scans on section planes of differing orientation and an analytical approach based on the Rietveld technique for analysis of powder diffraction patterns ( Ref 36 ). Fig. 6 Theta 2-theta x-ray diffraction scan for polycrystalline aluminum...
Abstract
This article describes the mechanisms involved in creating texture for various metal-fabrication processes, namely, solidification, deformation, recrystallization and grain growth, thin-film deposition, and imposition of external magnetic fields. It discusses two experimental and analytical approaches for experimental determination of texture: one using classical diffraction and pole figure measurement techniques and the other using individual orientation measurements. The article also provides information on microtexture, grain-boundary character, and texture gradients. It concludes with information on texture evolution through modeling.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.9781627081788
EISBN: 978-1-62708-178-8