This article describes the methods of X-ray diffraction analysis, the types of information that can be obtained, and its interpretation. The discussion covers the basic theories of X-rays and various types of diffraction experiments, namely single-crystal methods for polychromatic and monochromatic beams, powder diffraction methods, and the Rietveld method.

X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders, aggregates of finely divided material or polycrystalline specimens. This article provides a detailed account of XRPD. It begins with a discussion on XRPD instrumentation and the techniques used to characterize samples. The article then describes the principles, advantages, and disadvantages of various types of powder diffractometers. A section on the Rietveld method of diffraction analysis is then presented. The article discusses various methods and procedures for qualifying and quantifying phase mixtures in powder samples. It provides information on typical sensitivity and experimental limits on precision of XRPD analysis and other systematic sources of errors that affect accuracy. Some of the factors pertinent to the estimation of crystallite size and defects are also presented. The article ends with a few application examples of XRPD.

This article provides a brief introduction to neutron diffraction as well as its state-of-the-art capabilities. The discussion covers the general principles of the neutron, neutron-scattering theory, generation of neutrons, types of incident radiation, and purposes of single-crystal neutron diffraction, powder diffraction, and pair distribution function analysis. The relationship between detector space and reciprocal space are presented. Various factors involved in sample preparation, calibration, and techniques used for analyzing diffraction data are described. The article also presents application examples and possible future developments in neutron diffraction.

This article discusses the techniques and applications of synchrotron x-ray diffraction, providing information on x-ray generation, monochromation, and crystallography. X-ray diffraction techniques covered include single-crystal and powder diffraction. Some of the factors involved in the construction and development of macromolecular x-ray crystallography are also described.

This article discusses various concepts of micro x-ray diffraction (XRD) used for the examination of materials in situ. The discussion covers the principles, equipment used, sample preparation procedure, considerations for calibrating a detector, steps for performing data analysis, and applications and interpretation of micro-XRD.

Neutrons are a principal tool for the study of lattice vibrational spectra in materials. This article provides a detailed account of fission and spallation methods of neutron production that are capable of producing sufficient intensity to be useful in neutron scattering research. It describes the instrumentation required for, and advancements made in, neutron powder diffraction. The article further explains the texture and residual stress (macrostresses and microstresses) problems that are analyzed using the neutron powder diffraction method. It also outlines the single-crystal neutron diffraction technique, and provides examples of the applications of neutron diffraction.

This article describes the mechanisms involved in creating texture for various metal-fabrication processes, namely, solidification, deformation, recrystallization and grain growth, thin-film deposition, and imposition of external magnetic fields. It discusses two experimental and analytical approaches for experimental determination of texture: one using classical diffraction and pole figure measurement techniques and the other using individual orientation measurements. The article also provides information on microtexture, grain-boundary character, and texture gradients. It concludes with information on texture evolution through modeling.