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Raman spectroscopy

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006685
EISBN: 978-1-62708-213-6
... Abstract This article introduces the principles of Raman spectroscopy and the representative materials characterization applications to which Raman spectroscopy has been applied. A discussion on light-scattering fundamentals and a description of the experimental aspects of the technique...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001736
EISBN: 978-1-62708-178-8
... Abstract This article introduces the principles of Raman spectroscopy and the representative materials characterization applications to which Raman spectroscopy has been applied. It includes a discussion of light-scattering fundamentals and a description of the experimental aspects...
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Published: 31 December 2017
Fig. 4 MoO 3 content determined by Raman spectroscopy after heating for 1 hour in air: sput = sputtered film; sp = spray bonded; pow = powder, PLD = pulsed laser deposited; and crystal = single crystal. Source: Ref 35 More
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... spectroscopy, Auger electron spectroscopy, X-ray photoelectron spectroscopy, ion scattering spectroscopy, reflectance Fourier transform infrared absorption spectroscopy, Raman and surface enhanced Raman spectroscopy, and extended X-ray absorption fine structure analysis. corrosion corrosion inhibition...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
.... These methods include light microscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive X-ray spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy. atomic force...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006012
EISBN: 978-1-62708-172-6
... of nanotechnology and the development of smart coatings have been dependent largely on the availability of analytical and imaging techniques such as Raman spectroscopy, scanning and transmission electron microscopy, atomic force microscopy, and scanning tunneling microscopy. ball milling chemical vapor...
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Published: 15 December 2019
Fig. 1 Flow charts of common techniques for characterization of semiconductors. ICP-MS: inductively coupled mass spectrometry; ESR: electron spin resonance; NMR: nanomagnetic resonance; UV-vis: ultraviolet-visible spectroscopy; XRS: x-ray Raman spectroscopy; NAA: neutron activation analysis More
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Published: 15 December 2019
-AES, inductively coupled plasma atomic emission spectroscopy; IR, infrared spectroscopy; LEISS, low-energy ion-scattering spectroscopy; NAA, neutron activation analysis; OES, optical emission spectroscopy; OM, optical metallography; RBS, Rutherford backscattering spectrometry; RS, Raman spectroscopy More
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Published: 15 December 2019
chromatography; ICP-MS: inductively coupled plasma mass spectrometry; LC: liquid chromatography; LC/MS: liquid chromatography/mass spectrometry; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; RS: Raman spectroscopy; UV/VIS: ultraviolet/visible More
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Published: 15 December 2019
: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning electron microscopy; SIMS: secondary ion mass More
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Published: 15 December 2019
: liquid chromatography/mass spectrometry; LEISS: low-energy ion-scattering spectroscopy; MFS: molecular fluorescence spectroscopy; NAA: neutron activation analysis; NMR: nuclear magnetic resonance; OM: optical metallography; RS: Raman spectroscopy; SAXS: small-angle x-ray scattering; SEM: scanning More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... metallography; RS, Raman spectroscopy; SAXS, small-angle x-ray scattering; SEM, scanning electron microscopy; SIMS, secondary ion mass spectroscopy; TEM, transmission electron microscopy; UV/VIS, ultraviolet/visible absorption spectroscopy; XPS, x-ray photoelectron spectroscopy; XRD, x-ray diffraction; XRS, x...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... Spectroscopy Characterization Chemical fingerprinting of polymers and other nonmetallic materials can be performed on small specimens using FTIR or Raman spectroscopy. Both techniques are considered nondestructive and can be performed for identification of the bulk material, coatings, greases...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... SANS small-angle neutron scattering SAM scanning Auger microscopy SAXS small-angle x-ray scattering SEM scanning electron microscopy SERS surface-enhanced Raman spectroscopy SFC supercritical fluid chromatography SIMS secondary ion mass spectroscopy...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003719
EISBN: 978-1-62708-182-5
...-controlled recti er DG0 standard Gibbs free energy inhibition SEM scanning electron microscopy DH change in enthalpy mil 0.001 in. SERS surface enhanced Raman spectroscopy DK stress-intensity factor range MIL-STD military standard (U.S.) Sh Sherwood number DS entropy change min minimum; minute SHE standard...
Series: ASM Handbook
Volume: 13B
Publisher: ASM International
Published: 01 January 2005
DOI: 10.31399/asm.hb.v13b.9781627081832
EISBN: 978-1-62708-183-2
Series: ASM Handbook
Volume: 13B
Publisher: ASM International
Published: 01 January 2005
DOI: 10.31399/asm.hb.v13b.a0006540
EISBN: 978-1-62708-183-2
... of Corrosion SEM scanning electron microscopy ISO International Organization for SERS surface-enhanced Raman spectroscopy Engineers (now NACE International) Sh Sherwood number Standardization NHE normal hydrogen electrode SHE standard hydrogen electrode IR voltage drop; current multiplied by NIST National...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... … … … … … … … • • … … … … … • Raman spectroscopy N D, • D,• … D,• D,• D,• • • S • • … • … Scanning electron microscopy … … … … … … … … • … N N … … • Secondary ion mass spectroscopy • … S • • N … … • • • • • N N,S Small-angle x-ray scattering...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
... may have a more specific and specialized application, such as Raman spectroscopy for assessing the material quality of graphene sheets. Single-crystal semiconductors include some of the most common semiconducting materials, particularly single-crystal silicon, which is the basis for the majority...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
..., optical emission spectroscopy; OM, optical metallography; RBS, Rutherford backscattering spectrometry; RS, Raman spectroscopy; SEM, scanning electron microscopy; SIMS, secondary ion mass spectroscopy, SSMS, spark source mass spectrometry; TEM, transmission electron microscopy; XPS, x-ray photoelectron...