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Raman spectroscopy

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Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006685
EISBN: 978-1-62708-213-6
.... Source: Ref 5 Fig. 6 Optical scheme of MOLE instrument. Source: Ref 8 Abstract Abstract This article introduces the principles of Raman spectroscopy and the representative materials characterization applications to which Raman spectroscopy has been applied. A discussion on light...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001736
EISBN: 978-1-62708-178-8
... processes. Fig. 6 Optical scheme of MOLE instrument. Source: Ref 8 Abstract Abstract This article introduces the principles of Raman spectroscopy and the representative materials characterization applications to which Raman spectroscopy has been applied. It includes a discussion...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003710
EISBN: 978-1-62708-182-5
... spectroscopy, Auger electron spectroscopy, X-ray photoelectron spectroscopy, ion scattering spectroscopy, reflectance Fourier transform infrared absorption spectroscopy, Raman and surface enhanced Raman spectroscopy, and extended X-ray absorption fine structure analysis. corrosion corrosion inhibition...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005685
EISBN: 978-1-62708-198-6
.... These methods include light microscopy, scanning electron microscopy, atomic force microscopy, energy-dispersive X-ray spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy. atomic force...
Series: ASM Handbook
Volume: 5B
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v05b.a0006012
EISBN: 978-1-62708-172-6
... on the availability of analytical and imaging techniques such as Raman spectroscopy, scanning and transmission electron microscopy, atomic force microscopy, and scanning tunneling microscopy. References References 1. Tator K. , Nanotechnology: The Future of Coatings—Parts 1 and 2 , Mater. Perform...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006652
EISBN: 978-1-62708-213-6
... metallography; RS, Raman spectroscopy; SAXS, small-angle x-ray scattering; SEM, scanning electron microscopy; SIMS, secondary ion mass spectroscopy; TEM, transmission electron microscopy; UV/VIS, ultraviolet/visible absorption spectroscopy; XPS, x-ray photoelectron spectroscopy; XRD, x-ray diffraction; XRS, x...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... Surface Chemical Analysis Fourier Transform Infrared and Raman Spectroscopy Characterization Thermal Analysis as a Tool in Chemical Analysis X-Ray Diffraction for Compositional Analysis of Crystalline Materials Advancements in silicon drift detector technology allow for real-time or near...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
...; STM: scanning tunneling microscopy; SPM: scanning probe microscopy; RS: Raman spectroscopy Segregation ratios of impurities in silicon. A smaller ratio indicates that a solid solidifying from a melt will contain less of the indicated species; a higher ratio indicates that it will contain more...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006434
EISBN: 978-1-62708-192-4
... in atmospheres containing water vapor. This is done for burnished and bonded coatings by incorporating powders of other materials with MoS 2 during formulation or deposition ( Ref 31 , 32 , 33 , 34 ). Studies were conducted using Raman spectroscopy ( Ref 35 ) and other structure and surface analysis...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0005693
EISBN: 978-1-62708-178-8
... SANS small-angle neutron scattering SAM scanning Auger microscopy SAXS small-angle x-ray scattering SEM scanning electron microscopy SERS surface-enhanced Raman spectroscopy SFC supercritical fluid chromatography SIMS secondary ion mass spectroscopy...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006678
EISBN: 978-1-62708-213-6
... … … … … … … … • • … … … … … • Raman spectroscopy N D, • D,• … D,• D,• D,• • • S • • … • … Scanning electron microscopy … … … … … … … … • … N N … … • Secondary ion mass spectroscopy • … S • • N … … • • • • • N N,S Small-angle x-ray scattering...
Series: ASM Handbook
Volume: 13B
Publisher: ASM International
Published: 01 January 2005
DOI: 10.31399/asm.hb.v13b.9781627081832
EISBN: 978-1-62708-183-2
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006671
EISBN: 978-1-62708-213-6
... ● ● ● ● … … S ● ● … … … Optical emission spectroscopy ● … … ● ● ● ● … … ● ● ● … … … Optical metallography … … … … … … ● ● … … … … … … ● Rutherford backscattering spectrometry ● … … ● ● ● … … ● ● S S … … … Raman spectroscopy S S … S S S S S...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006377
EISBN: 978-1-62708-192-4
... Raman spectroscopy, it was determined that humidity, for example, surface water, does not play a role in the oxidation of MoS 2 ( Ref 23 ). In addition, this study showed that localized heating/surface chemistry can occur through rapid oxidation when using a high-power 632.8 nm laser, and this laser...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006662
EISBN: 978-1-62708-213-6
... of the Society of Photo-Optical Instrumentation Engineers , Vol 191 , Vannasse G.A. , Ed., Society of Photo-Optical Instrumentation Engineers , Bellingham, WA , 1979 15. Griffiths P.R. , in Advances in Infrared and Raman Spectroscopy , Vol 10 , Clark R.J.H. and Hester R.E. , Ed...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001735
EISBN: 978-1-62708-178-8
... , Bellingham, WA , 1979 13. Griffiths P.R. , in Advances in Infrared and Raman Spectroscopy , Vol 10 , Clark R.J.H. and Hester R.E. , Ed., Heyden , 1983 14. McDowell R.S. , in Advances in Infrared and Raman Spectroscopy , Vol 5 , Clark R.J.H. and Hester...
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001726
EISBN: 978-1-62708-178-8
... spectroscopy MFS Molecular fluorescence spectroscopy NAA Neutron activation analysis NMR Nuclear magnetic resonance OES Optical emission spectroscopy OM Optical metallography RBS Rutherford backscattering spectrometry RS Raman spectroscopy SAXS Small-angle x-ray scattering...
Series: ASM Handbook
Volume: 18
Publisher: ASM International
Published: 31 December 2017
DOI: 10.31399/asm.hb.v18.a0006360
EISBN: 978-1-62708-192-4
... relationships need to be understood. Analytical techniques in materials science such as Raman spectroscopy, analytical TEM, and x-ray photoelectron spectroscopy (XPS) are used to reveal film structure details that can be correlated to layer properties and performance. Raman spectroscopy relies on inelastic...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Series: ASM Handbook
Volume: 21
Publisher: ASM International
Published: 01 January 2001
DOI: 10.31399/asm.hb.v21.a0003374
EISBN: 978-1-62708-195-5
..., but was not sensitive to well-bonded interfaces. Wu used localized heating coupled with acoustic emission events to detect interfacial debonding ( Ref 34 ). Laser Raman spectroscopy can be applied to the fiber-matrix interface in order to determine the actual stresses that exist at the interface. Laser Raman...