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Peltier effects

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Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005625
EISBN: 978-1-62708-174-0
... resistance-welded joints. The various resistance-welded joints include spot welds, projection welds, seam welds, and butt welds. The article explains the relative contributions of the Joule, Peltier, and Thomson effects for typical RW scenarios. It concludes with information on the electrode “follow...
Series: ASM Handbook
Volume: 20
Publisher: ASM International
Published: 01 January 1997
DOI: 10.31399/asm.hb.v20.a0002475
EISBN: 978-1-62708-194-8
.../heaters may be required. They increasingly employ Peltier-effect junctions. Essentially all electronic structures have thin-film layers of insulators and conductors. The interlayer adhesion is, as already mentioned, an extremely important design consideration that often requires compromises...
Series: ASM Handbook
Volume: 2
Publisher: ASM International
Published: 01 January 1990
DOI: 10.31399/asm.hb.v02.a0001092
EISBN: 978-1-62708-162-7
... and aluminum to improve machinability; In wrought iron it reduces the formation of graphite on freezing. Another application of bismuth is in thermoelectric devices containing intermetallic compounds of bismuth with selenium and/or tellurium; these devices make use of the Peltier effect for refrigeration. Some...
Series: ASM Handbook
Volume: 23
Publisher: ASM International
Published: 01 June 2012
DOI: 10.31399/asm.hb.v23.a0005655
EISBN: 978-1-62708-198-6
.... , Definitions in Biomaterials , Elsevier , 1987 2. Williams D. , The Williams Dictionary of Biomaterials , Liverpool University Press , 1999 3. Dreesman H. , Über Knochenplombierung , Beitr Klin Chir. , Vol 9 , 1892 , p 804 – 910 4. Peltier L. , Bickel E...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006648
EISBN: 978-1-62708-213-6
.... In this source, cooling and reduction of temperature variations, which may affect ion signals, are achieved by Peltier cooling or circulating fluid from a chiller. Fast-flow design does not exhibit as many molecular species, due to the higher power (50 to 100 W) in the plasma; therefore, cooling is less critical...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
.... This results in achievable count rates on the order of 1,000,000 counts/second. Another advantage of an SDD system over a silicon-lithium detector is that with the elimination of lithium in the detector chip, the device can be cooled using a Peltier cooler, eliminating the need for constantly refilling...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006643
EISBN: 978-1-62708-213-6
... of 0D detectors. A wavelength-dispersive detector operates on electronic energy discrimination of the components of a polychromatic beam, resulting in the simultaneous accumulation of the intensities of many different wavelengths. A cooling system (liquid nitrogen or Peltier cooler) is employed...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003744
EISBN: 978-1-62708-177-1
..., electrical resistivity, dielectric constant, Thomson coefficient, Peltier coefficient, and index of refraction. Table 1 contains an example set of values of various properties for given materials indicating their anisotropic nature. Table 1 Directional dependence of certain mechanical and physical...
Series: ASM Handbook
Volume: 13A
Publisher: ASM International
Published: 01 January 2003
DOI: 10.31399/asm.hb.v13a.a0003687
EISBN: 978-1-62708-182-5
...Abstract Abstract This article discusses the various factors that affect the corrosion performance of electroplated coatings. It describes the effects of environment and the deposition process on substrate coatings. The article provides a discussion on the electrochemical techniques capable...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006638
EISBN: 978-1-62708-213-6
... pure elements represents a finite deviation from the pure value. The impact of the native oxide can be minimized by operating at higher incident beam energy, E 0 ≥ 15 keV, but the effect of the native oxide (or contamination layers) can be significant for low-beam-energy analysis (e.g., E 0 ≤ 5...
Series: ASM Handbook
Volume: 2
Publisher: ASM International
Published: 01 January 1990
DOI: 10.31399/asm.hb.v02.a0001064
EISBN: 978-1-62708-162-7
... A.R. , Report FR 100754, U.S. Air Force Materials Laboratories, Aug 1978 57. Gilman P.S. , Zedalis M.S. , Peltier J.M. , and Das S.K. , Rapidly Solidified Aluminum , in Transition Metal Alloys for Aerospace Applications 58. Rapidly Solidified Aluminum Al-Fe-V-Si...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003757
EISBN: 978-1-62708-177-1
.... The dark current, the amount of charge stored due to thermal activation when there is no light hitting the camera. This noise image is added to all acquired images. In scientific-grade cameras the dark current is reduced by cooling the sensor with a Peltier diode. (Operating between −20 and −30 °C, or −4...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006668
EISBN: 978-1-62708-213-6
.... , Angularly-Selective Transmission Imaging in a Scanning Electron Microscope , Ultramicroscopy , Vol 167 , Aug 2016 , p 43 – 56 , 10.1016/j.ultramic.2016.05.001 10. Woehl T. and Keller R. , Dark-Field Image Contrast in Transmission Scanning ElectronMicroscopy: Effects of Substrate...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
... in an Imperfect World: Limitations of Focused Ion Beam Systems and Their Effects on Advanced Applications at the 14 nm Process Node , Proc. 42nd Int. Symp. Test. Failure Anal. , Nov 2016 31. Ievlev A.V. , Jakowski J. , Burch M.J. , Iberi V. , Hysmith H. , Joy D.C...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6