Search Results for Lorentz transmission electron microscopy

Microstructural analysis of specialized types of magnetic materials is centered on the examination of optical, electron, and scanning probe metallographic techniques unique to magnetic materials. This article provides a comprehensive overview of magnetic materials, their characteristics and sample preparation procedures. It reviews the methods pertaining to the microstructural examination of bulk magnetic materials, including microscopy techniques specified to magnetic materials characterization, with specific examples. The techniques used in the study of magnetic domain structures (microstructure) include the magneto-optical Kerr method, the Faraday method, the Bitter technique, scanning electron microscopy (magnetic contrast Types I and II), scanning electron microscopy with polarization analysis, Lorentz transmission electron microscopy, and magnetic force microscopy. The article also illustrates the microstructure of different types of soft magnetic material and permanent magnets.

Scanning electron microscopy (SEM) has shown various significant improvements since it first became available in 1965. These improvements include enhanced resolution, dependability, ease of operation, and reduction in size and cost. This article provides a detailed account of the instrumentation and principles of SEM, broadly explaining its capabilities in resolution and depth of field imaging. It describes three additional functions of SEM, including the use of channeling patterns to evaluate the crystallographic orientation of micron-sized regions; use of backscattered detectors to reveal grain boundaries on unetched samples and domain boundaries in ferromagnetic alloys; and the use of voltage contrast, electron beam-induced currents, and cathodoluminescence for the characterization and failure analysis of semiconductor devices. The article compares the features of SEM with that of scanning Auger microscopes, and lists the applications and limitations of SEM.

This article provides detailed information on the instrumentation and principles of the scanning electron microscope (SEM). It begins with a description of the primary components of a conventional SEM instrument. This is followed by a discussion on the advantages and disadvantages of the SEM compared with other common microscopy and microanalysis techniques. The following sections cover the critical issues regarding sample preparation, the physical principles regarding electron beam-sample interaction, and the mechanisms for many types of image contrast. The article also presents the details of SEM-based techniques and specialized SEM instruments. It ends with example applications of various SEM modes.

Analytical transmission electron microscopy (ATEM) is unique among materials characterization techniques as it enables essentially the simultaneous examination of microstructural features through high-resolution imaging and the acquisition of chemical and crystallographic information from small regions of the specimen. This article illustrates the effectiveness of the technique in solving materials problems. The first section of the article provides information on analytical electron microscope (AEM) and its basic operational characteristics as well as on electron optics, electron beam/specimen interactions and the generation of a signal, signal detectors, electron diffraction, imaging, x-ray microanalysis, electron energy loss spectroscopy, and sample preparation. The second section consists of 12 examples, each illustrating a specific type of materials problem that can be solved, at least in part, with AEM.

This article describes the fundamental theory of magnetic pulse welding (MPW). It reviews the equipment used for MPW, namely, work coil, capacitor bank, high-voltage power supply, high-voltage switches, and field shapers. The article discusses the MPW process and explains the critical parameters needed to obtain acceptable welds. Applications and safety guidelines of the MPW are also presented.

Superconductivity has been found in a wide range of materials, including pure metals, alloys, compounds, oxides, and organic materials. Providing information on the basic principles, this article discusses the theoretical background, types of superconductors, and critical parameters of superconductivity. It discusses the magnetic properties of selected superconductors and types of stabilization, including cryogenic stability, adiabatic stability, and dynamic stability. The article also focuses on alternating current losses in superconductors, including hysteresis loss, penetration loss, eddy current loss, and radio frequency loss. Furthermore, the article describes the flux pinning phenomenon and Josephson effects.

This article outlines the beam/sample interactions and the basic instrumental design of a scanning electron microscopy (SEM), which include the electron gun, probeforming column (consisting of magnetic electron lenses, apertures, and scanning coils), electron detectors, and vacuum system. It discusses the contrasts mechanisms used for imaging and analyzing materials in the SEM. These include the topographic contrast, compositional contrast, and electron channeling pattern and orientation contrast. Special instrumentation and accessory equipment used at elevated pressures and during the X-ray microanalysis are reviewed. The article also provides information on the sample preparation procedure and the materials applications of the SEM.

X-ray topography is the general term for a family of x-ray diffraction imaging techniques capable of providing information on the nature and distribution of imperfections. This article provides a detailed account of x-ray topography techniques, providing information on the historical background and development trends in x-ray diffraction topography. The discussion covers the general principles, components of systems, and applications of x-ray topography techniques, namely conventional X-ray topographic techniques and synchrotron x-ray topographic techniques.

This article provides an overview of the characteristics of Rayleigh waves plus methods for generation and detection of waves, including using piezoelectric transducers or noncontact techniques such as lasers, electromagnetic acoustic transducers, or air-coupled ultrasonics. It reviews the methods for using Rayleigh waves for defect detection and materials characterization, alongside nonlinear ultrasonic inspection and surface acoustic wave (SAW) microscopy. The article concludes with information on the standards that use Rayleigh waves for nondestructive evaluation (NDE) of different structures.

This article discusses various concepts of micro x-ray diffraction (XRD) used for the examination of materials in situ. The discussion covers the principles, equipment used, sample preparation procedure, considerations for calibrating a detector, steps for performing data analysis, and applications and interpretation of micro-XRD.

This article discusses the advantages, disadvantages, applications, and selection criteria of various technologies and transduction modalities that can generate and detect ultrasonic waves. These include piezoelectric transducers, electromagnetic acoustic transducers (EMATs), laser ultrasound phased array transducers, magnetostriction transducers, and couplants. The article discusses four basic types of search units with piezoelectric transducers. These include the straight-beam contact type, the angle-beam contact type, the dual-element contact type, and the immersion type. The article concludes with information on immersion or contact type focused search units.

Microjoining with high energy density beams is a new subject in the sense that the progress of miniaturization in industry has made the desire to make microjoints rapidly and reliably a current and exciting topic. This article summarizes the current state of microjoining with both electron and laser beams. It considers the elementary physical processes such as heat and fluid flow to introduce the reader to the phenomena that affect melting, coalescence, and solidification needed for a successful microweld. The various forces driving (and resisting) fluid flow are analyzed. The article discusses the equipment suitable for microjoining and the metallurgical consequences and postweld metrology of the process. It also provides examples of developmental welds employing laser and electron beam microwelding techniques.

Metallographic contrasting methods include various electrochemical, optical, and physical etching techniques, which in turn are enhanced by the formation of a thin transparent film on the specimen surface. This article primarily discusses etching in conjunction with light microscopy and describes several methods for film formation, namely, heat tinting, color etching, anodizing, potentiostatic etching, vapor deposition, and film deposition by sputtering. It provides information on the general procedures and precautions for etchants and reagents used in metallographic microetching, macroetching, electropolishing, chemical polishing, and other similar operations.

Stainless steel alloys have many unique failure mechanisms, including environmentally assisted cracking, cracking associated with welding, and secondary phase embrittlement. This article describes these failure mechanisms and the fracture modes associated with the different categories of stainless steel. These mechanisms and modes are grouped together because of their similarities across the categories.

X-ray powder diffraction (XRPD) techniques are used to characterize samples in the form of loose powders, aggregates of finely divided material or polycrystalline specimens. This article provides a detailed account of XRPD. It begins with a discussion on XRPD instrumentation and the techniques used to characterize samples. The article then describes the principles, advantages, and disadvantages of various types of powder diffractometers. A section on the Rietveld method of diffraction analysis is then presented. The article discusses various methods and procedures for qualifying and quantifying phase mixtures in powder samples. It provides information on typical sensitivity and experimental limits on precision of XRPD analysis and other systematic sources of errors that affect accuracy. Some of the factors pertinent to the estimation of crystallite size and defects are also presented. The article ends with a few application examples of XRPD.