1-10 of 10 Search Results for

FIB circuit edit

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Image
Published: 15 December 2019
Fig. 65 Most basic circuit edit with focused ion beam (FIB) cuts and FIB-deposited metal lines to connect one layer to the next More
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006677
EISBN: 978-1-62708-213-6
... specialized configurations for narrow applications, such as neural mapping in biology ( Ref 1 ), and within the semiconductor industry ( Ref 2 ), such as metrology, mask repair, and circuit edit. Some instruments have the FIB at a 90° angle relative to the SEM. In some cases, the FIB is vertical and the SEM...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003760
EISBN: 978-1-62708-177-1
... that a Buehler Minimet was used to polish the material, and picral and nital were used as etchants. A “motion-picture” sequence of serial sections was produced. Individual precipitates were reconstructed by cropping and editing images to contain only regions of interest. The total number of sections was only 125...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.9781627082136
EISBN: 978-1-62708-213-6
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006641
EISBN: 978-1-62708-213-6
... is the most important semiconductor material for the semiconductor industry, with increasingly sophisticated integrated circuits built almost entirely on a silicon substrate. Silicon is also one of the most widely used semiconductor materials in PV technology to manufacture solar cells. Crystalline silicon...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006670
EISBN: 978-1-62708-213-6
... precise tools such as focused ion beam (FIB) systems appropriate for 5 to 50 μm scale cross sections; and plasma FIB systems, which lie between these two approaches. With the right ion beam, it is possible to make larger cross sections that may fully transect parts, with vertical dimensions up to 1 to 2...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006748
EISBN: 978-1-62708-213-6
... characteristic radiation from the target. function of the relative transmittance of the FIB-SEM. An instrument that includes both a photographic emulsion versus a function of excitation volume. The volume within the focused ion beam (FIB) and a scanning elec- the exposure. The calibration curve is used sample...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 December 1998
DOI: 10.31399/asm.hb.mhde2.a0003177
EISBN: 978-1-62708-199-3
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006943
EISBN: 978-1-62708-395-9
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.9781627083959
EISBN: 978-1-62708-395-9