1-20 of 87 Search Results for

C-mode scanning acoustic microscopy

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Image
Published: 01 August 2018
Fig. 14 50 MHz C-mode scanning acoustic microscopy reflection-mode micrograph of a carbon-fiber-reinforced plastic test sample. The ultrasound was focused near the top surface of the sample. Field of view: 19 × 14 mm More
Image
Published: 01 August 2018
Fig. 23 C-mode scanning acoustic microscopy reflection-mode image at 50 MHz made by setting the gate and focus to approximately 1 mm (0.04 in.) below the surface. The white circular spots correspond to individual pores located at this depth. Field of view: 30 × 30 mm More
Image
Published: 01 August 2018
Fig. 32 C-mode scanning acoustic microscopy reflection-mode image at 15 MHz of a plastic-encapsulated integrated circuit showing a suspicious area of the lead frame. In this image, the brightness of the image (toward white) represents the magnitude of the echoes from the interface More
Image
Published: 01 August 2018
Fig. 41 Edge effect in (a) C-mode scanning acoustic microscopy (C-SAM) and (b) scanning laser acoustic microscopy (SLAM). In the case of C-SAM, when the transducer is too close to the left edge of a sample having thickness t , the acoustic beam becomes cut off, and the echo signal does More
Image
Published: 01 August 2018
Fig. 31 Schematic illustrating use of the C-mode scanning acoustic microscopy reflection technique to evaluate the die-attach bond between the silicon die and the ceramic package of a ceramic dual in-line package integrated circuit. With this technique, the ultrasound access to the bond layer More
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006466
EISBN: 978-1-62708-190-0
... Abstract This article discusses the fundamentals and operating principles of the following acoustic microscopy methods: scanning laser acoustic microscopy, C-mode scanning acoustic microscopy, and scanning acoustic microscopy. It describes the applications of acoustic microscopy for detecting...
Image
Published: 01 August 2018
Fig. 9 Comparison of acoustic microscopy applications with C-scan applications, based on transducer frequency and wavelength. C-SAM, C-mode scanning acoustic microscopy; SLAM, scanning laser acoustic microscopy; SAM, scanning acoustic microscopy; NDT, nondestructive testing; IC, integrated More
Image
Published: 01 August 2018
Fig. 8 Simplified comparison of three acoustic microscopy techniques, particularly their zones of application (crosshatched area) within a sample. (a) Scanning laser acoustic microscopy. (b) Scanning acoustic microscopy. (c) C-mode scanning acoustic microscopy More
Image
Published: 01 August 2018
indicated in the color micrograph. This is explained by the fact that the scanning laser acoustic microscope shows the disbonds on either side of the lead frame, that is, two interfaces, while the C-mode scanning acoustic microscopy (C-SAM) image shows only one interface. When the integrated circuit More
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006461
EISBN: 978-1-62708-190-0
... or two transducers to study the reflected waves ( Fig. 4a , b) or measure the transmission using two transducers ( Fig. 4c ). Fig. 4 Schematic of the experimental setup used for measuring (a), (b) the reflection coefficient, using pulse-echo or pitch-catch modes, and (c) the transmission...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006658
EISBN: 978-1-62708-213-6
... conductive material, or the bottom side of the cantilever can be coated with metal. Conductive AFM Conductive AFM (C-AFM) images are made while scanning in contact mode and monitoring the current flow between the probe and surface. A potential source and electrometer are connected between the probe...
Series: ASM Handbook
Volume: 10
Publisher: ASM International
Published: 15 December 2019
DOI: 10.31399/asm.hb.v10.a0006633
EISBN: 978-1-62708-213-6
... applications. Fig. 4 Scanning tunneling microscope images of evaporated C 60 film on gold-coated freshly cleaved mica using a mechanically sheared platinum-iridium (80/20) tip in constant-height mode. Source: Ref 125 . © IOP Publishing. Reproduced with permission. All rights reserved...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006471
EISBN: 978-1-62708-190-0
... conversion efficiency, and negligible mode interaction. The main disadvantages of lithium sulfate elements are fragility and a maximum service temperature of approximately 75 °C (165 °F). Polarized Ceramics Polarized ceramics come with many compositions and generally have high electromechanical...
Series: ASM Handbook
Volume: 19
Publisher: ASM International
Published: 01 January 1996
DOI: 10.31399/asm.hb.v19.a0002363
EISBN: 978-1-62708-193-1
... force microscopy, and scanning acoustic microscopy. The article also reviews the X-ray diffraction technique used for determining the compositional changes, strain changes, and residual stress evaluation during the fatigue process. acoustic emission technique atomic force microscopy crack growth...
Series: ASM Handbook
Volume: 6
Publisher: ASM International
Published: 01 January 1993
DOI: 10.31399/asm.hb.v06.9781627081733
EISBN: 978-1-62708-173-3
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006477
EISBN: 978-1-62708-190-0
...-scan inspection technique interrogating the bonding plane has been developed by combining a data-reduction technique with pattern-recognition algorithms ( Ref 8 , 9 ). A set of inertia-bonded copper-to-stainless steel samples showed a good correlation with the bond strengths and the C-scan procedure...
Series: ASM Handbook
Volume: 17
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.hb.v17.a0006470
EISBN: 978-1-62708-190-0
... the values listed in Table 1 . Acoustic properties of several metals and nonmetals Table 1 Acoustic properties of several metals and nonmetals Material Density (ρ), kg/m 3 Sonic velocities, m/s Acoustic impedance ( Z 1 ) (d) , MRayl V l (a) V t (b) V s (c) Ferrous...
Series: ASM Handbook
Volume: 6A
Publisher: ASM International
Published: 31 October 2011
DOI: 10.31399/asm.hb.v06a.a0005616
EISBN: 978-1-62708-174-0
... conditions such as time, temperature, and force. An ultrasonic C-scan inspection technique interrogating the bonding plane has been developed by combining a data-reduction technique with pattern-recognition algorithms ( Ref 8 , 9 ). A set of inertia-bonded copper-to-stainless steel samples showed a good...
Series: ASM Handbook
Volume: 9
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.hb.v09.a0003755
EISBN: 978-1-62708-177-1
... electron microscopy at high vacuum (10 −3 Pa). Volatile components (hydrocarbons) are lost. 4000×. (c) Environmental scanning electron microscopy at a relative humidity of 91% (temperature = 5 °C, or 40 °F). Due to the presence of soluble components within the complex agglomerates, the formation of water...
Series: ASM Desk Editions
Publisher: ASM International
Published: 01 November 1995
DOI: 10.31399/asm.hb.emde.a0003057
EISBN: 978-1-62708-200-6
... ionized gas, such as argon, extremely hot (more than 10,000 °C, or 18,030 °F), and stable and chemically inert, in order to bring the atoms of any elements up to very high excitation levels. There are two methods for obtaining the plasma: direct current and inductively coupling radio frequency (ICP) ( Fig...