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Book: Powder Metallurgy
Series: ASM Handbook
Volume: 7
Publisher: ASM International
Published: 30 September 2015
DOI: 10.31399/asm.hb.v07.a0006094
EISBN: 978-1-62708-175-7
Abstract
Superalloys are predominantly nickel-base alloys that are strengthened by solid-solution elements including molybdenum, tungsten, cobalt, and by precipitation of a Ni 3 (Al, Ti) type compound designated as gamma prime and/or a metastable Ni 3 Nb precipitate designated as gamma double prime. This article provides a discussion on the conventional processing, compositions, characteristics, mechanical properties, and applications of powder metallurgy (PM) superalloys. The conventional processing of PM superalloys involves production of spherical prealloyed powder, screening to a suitable maximum particle size, blending the powder to homogenize powder size distribution, loading powder into containers, vacuum outgassing and sealing the containers, and consolidating the powder to full density. PM superalloys include Rene 95, IN-100, LC Astroloy, Udimet 720, N18, ME16, RR1000, Rene 88DT, PA101, MERL 76, AF2-1DA, Inconel 706, AF115, and KM4. The article reviews specialized PM superalloy processes and technical issues in the usage of PM superalloys.
Series: ASM Handbook Archive
Volume: 10
Publisher: ASM International
Published: 01 January 1986
DOI: 10.31399/asm.hb.v10.a0001766
EISBN: 978-1-62708-178-8
Abstract
Analytical transmission electron microscopy (ATEM) is unique among materials characterization techniques as it enables essentially the simultaneous examination of microstructural features through high-resolution imaging and the acquisition of chemical and crystallographic information from small regions of the specimen. This article illustrates the effectiveness of the technique in solving materials problems. The first section of the article provides information on analytical electron microscope (AEM) and its basic operational characteristics as well as on electron optics, electron beam/specimen interactions and the generation of a signal, signal detectors, electron diffraction, imaging, x-ray microanalysis, electron energy loss spectroscopy, and sample preparation. The second section consists of 12 examples, each illustrating a specific type of materials problem that can be solved, at least in part, with AEM.