The discussion on the fracture of solid materials, both metals and polymers, customarily begins with a presentation of the stress-strain behavior and of how various conditions such as temperature and strain-rate affect the mechanisms of deformation and fracture. This article describes crazing and fracture in polymeric materials, with a review of the behavior of the elastic modulus as a function of temperature or time parameters, emphasizing the importance of the viscoelastic nature of their deformation and fracture. The discussion covers the behavior of polymers under stress, provides information on ductile and brittle behaviors, and describes craze initiation in polymers and crack formation and fracture by crazing. Macroscopic permanent deformation of polymeric materials caused by shear-yielding and crazing, which eventually can result in fracture and failure, is also covered.

The scanning electron microscope (SEM) is one of the most versatile instruments for investigating the microscopic features of most solid materials. The SEM provides the user with an unparalleled ability to observe and quantify the surface of a sample. This article discusses the development of SEM technology and operating principles of basic systems of SEM. The basic systems covered include the electron optical column, signal detection and display equipment, and the vacuum system. The processes involved in the preparation of samples for observation using an SEM are described, and the application of SEM in fractography is discussed. The article covers the failure mechanisms of ductile failure, brittle failure, mixed-mode failure, and fatigue failure. Lastly, image dependence on microscope type and operating parameters is also discussed.

The purpose of fractography is to analyze fracture features and attempt to relate the topography of the fracture surface to the causes and/or basic mechanisms of fracture. This article reviews the historical development of fractography, from the early studies of fracture appearance dating back to the sixteenth century to the state-of-the-art work in electron fractography and quantitative fractography. It also describes the applications and limitations of scanning electron microscope and transmission electron microscope.