Additive manufacturing (AM) process modalities offer access to rich sets of structures for metallic materials that are otherwise difficult to obtain through a single conventional manufacturing process for bulk-scale materials. This article presents the primary aim of understanding the linkage between the process and structure in AM, which is typically focused on the correlation of machine process settings to defects such as material porosity and cracking. It also presents the development of scan strategies for site-specific microstructure control and discusses factors influencing process-structure relationships in fusion metals AM.

This article briefly introduces the concept of creep properties of additively manufactured (AM) alloys, with a focus on the effects of the characteristic microstructure of AM alloys on creep performance. Relevant post-processing treatment also is discussed, in relation to improved creep performance based on the improvement of AM initial microstructure.

The first part of this article focuses on two major forms of machining-related failures, namely machining workpiece (in-process) failures and machined part (in-service) failures. Discussion centers on machining conditions and metallurgical factors contributing to (in-process) workpiece failures, and undesired surface layers and metallurgical factors contributing to (in-service) machined part failures. The second part of the article discusses the effects of microstructure on machining failures and their preventive measures.

Directed-energy deposition (DED) is a kind of additive manufacturing (AM) technology based on synchronous powder feeding or wire feeding. This article provides a comprehensive coverage of DED for ceramic AM, beginning with an overview of DED equipment setup, followed by a discussion on DED materials and the DED deposition process. The bulk of the article is devoted to the discussion on the microstructure and properties of oxide ceramics, namely alumina and zirconia ceramics.

This article provides a general overview of additively manufactured steels and focuses on specific challenges and opportunities associated with additive manufacturing (AM) stainless steels. It briefly reviews the classification of the different types of steels, the most common AM processes used for steel, and available powder feedstock characteristics. The article emphasizes the characteristics of the as-built microstructure, including porosity, inclusions, and residual stresses. It also reviews the material properties of AM steel parts, including hardness, tensile strength, and fatigue strength, as well as environmental properties with respect to corrosion resistance, highlighting the importance of postbuild thermal processing.

Traditional processing methods for the part production of Co-Cr alloys include casting, powder metallurgy, and metal forming. However, the steps involved during materials processing followed by metal forming and machining are time consuming and fraught with processing variables. Three-dimensional (3D) printing enables rapid evolution in design, personalization, and so on. This article presents a brief description of some common additive manufacturing (AM) processes for the production of cobalt alloy parts, and provides a comparison between AM and conventional processing methods. The discussion is centered on process-microstructure-properties correlation in additively manufactured cobalt alloys and applications of these alloys.

This article focuses on a study that was performed to understand the effects of powder attributes; process parameters; and hot isostatic pressing (HIP) treatment on the densification, mechanical and corrosion properties, and microstructures of 17-4 PH stainless steel gas- and water-atomized laser-powder bed fusion (LPBF) parts at various energy densities. The results from the study showed the strong dependence of densification, mechanical properties, and microstructures on temperature, pressure, and time during the HIP cycle. The density, ultimate tensile strength, hardness and yield strength of gas and water-atomized LPBF parts increased due to HIP treatment and were higher than as-printed properties. The results also confirmed superior corrosion performance of the HIP treated LPBF parts.

This article provides a detailed account of the basic concepts of Rutherford backscattering spectrometry (RBS). It begins with a description of the principles of RBS, as well as the effect of channeling in conjunction with backscattering measurements and the effect of energy loss under this condition. This is followed by a section on equipment used in RBS analysis. Channel-energy conversion, energy-depth conversion, and separation of the dechanneling background are then discussed as the main steps of RBS data analysis. The article also discusses the applications of RBS—including composition of bulk samples, thin-film composition and layer thickness, impurity profiles, damage depth profile, and surface peak—as well as the various codes developed to simulate it.

This article is a brief account of low-energy ion-scattering spectroscopy (LEIS) for determining the atomic structure of solid surfaces. It begins with a description of the general principles of LEIS. This is followed by a section providing information on the equipment used for LEIS. Various steps involved in the sample preparation, calibration, and data analysis are then discussed. The article concludes with a section on the applications and interpretation of LEIS in material analysis, including discussion on surface structural analysis, layer-by-layer (Frank-van der Merwe) growth, and low-energy atom-scattering spectroscopy.

This article provides a detailed account of extended x-ray absorption fine structure (EXAFS). It begins with a description of the fundamentals of EXAFS, providing information on the physical mechanism, single-scattering approximation, and multiple-scattering effects. This is followed by a discussion on the use of synchrotron radiation as an X-ray source for EXAFS. Data-reduction procedures used to extract EXAFS signals are then described. The article also provides information on the analysis of x-ray absorption near-edge structure spectrum and ends with a discussion on the unique features and applications of EXAFS.

This article describes the methods of X-ray diffraction analysis, the types of information that can be obtained, and its interpretation. The discussion covers the basic theories of X-rays and various types of diffraction experiments, namely single-crystal methods for polychromatic and monochromatic beams, powder diffraction methods, and the Rietveld method.

This article provides a detailed account of the concepts of single-crystal x-ray diffraction (XRD). It begins with a historical review of XRD methods, followed by a description of the various factors involved in crystal symmetry. The article then focuses on the phase problem in x-ray structural analysis and validation of the structural model. Some of the factors to be considered for performing experimental procedure are provided. The article presents several examples of applications of single-crystal XRD. The following sections cover the crystallographic problem in terms of structural analysis, software programs for crystal structure solution and refinement, and visualization of crystal structures. The article ends with a discussion on various databases available for single-crystal XRD analysis.

X-ray topography is the general term for a family of x-ray diffraction imaging techniques capable of providing information on the nature and distribution of imperfections. This article provides a detailed account of x-ray topography techniques, providing information on the historical background and development trends in x-ray diffraction topography. The discussion covers the general principles, components of systems, and applications of x-ray topography techniques, namely conventional X-ray topographic techniques and synchrotron x-ray topographic techniques.

This article discusses the techniques and applications of synchrotron x-ray diffraction, providing information on x-ray generation, monochromation, and crystallography. X-ray diffraction techniques covered include single-crystal and powder diffraction. Some of the factors involved in the construction and development of macromolecular x-ray crystallography are also described.

The reflected light microscope is the most commonly used tool to study the microstructure of metals, composites, ceramics, minerals, and polymers. For the study of the microstructure of metals and alloys, light microscopy is employed in the reflected-light mode using either bright-field illumination, dark-field illumination, polarized light illumination, or differential interference contract, generally by the Nomarski technique. This article concentrates on how to reveal microstructure properly to enable the proper identification of the phases and constituents and, if needed, measuring the amount, size, and spacing of constituents, using the light optical microscope. The discussion covers the examination of microstructures using different illumination methods and includes a comparison between light optical images and scanning electron microscopy images of microstructure.

The electron backscatter diffraction (EBSD) technique has proven to be very useful in the measurement of crystallographic textures, orientation relationships between phases, and both plastic and elastic strains. This article focuses on backscatter diffraction in a scanning electron microscope and describes transmission Kikuchi diffraction. It begins with a discussion on the origins of EBSD and the collection of EBSD patterns. This is followed by sections providing information on EBSD spatial resolution and system operation of EBSD. Various factors pertinent to perform an EBSD experiment are then covered. The article further describes the processes involved in sample preparation that are critical to the success or usefulness of an EBSD experiment. It also discusses the applications of EBSD to bulk samples and the development of EBSD indexing methods.

Transmission electron microscopy (TEM) approach enables essentially simultaneous examination of microstructural features through imaging from lower magnifications to atomic resolution and the acquisition of chemical and crystallographic information from small regions of the thin specimen. This article discusses fundamentals of the technique, especially for solving materials problems. Background information is provided to help understand basic operations and principles, including instrumentation, the physics of signal generation and detection, image formation, electron diffraction, and spectrometry techniques with data analysis.

This article is intended to provide the reader with a good understanding of the underlying science, technology, and the most common applications of focused ion beam (FIB) instruments. It begins with a survey of the various types of FIB instruments and their configurations, discusses the essential components, and explains their function only to the extent that it helps the operator obtain the desired results. An explanation of how the components of ion optical column shape and steer the ion beam to the desired target locations is then provided. The article also reviews the many diverse accessories and options that enable the instrument to realize its full potential across all of the varied applications. This is followed by a detailed analysis of the physical processes associated with the ion beam interacting with the sample. Finally, a complete survey of the most prominent FIB applications is presented.