Microelectronics Failure Analysis: Desk Reference (Seventh Edition)
The Power of Semiconductor Memory Failure Signature Analysis
Semiconductor memories are superb drivers for process yield and reliability improvement because of their highly structured architecture and use of aggressive layout rules. This combination provides outstanding failure signature analysis possibilities for the entire design, manufacturing, and test process. This article discusses five key disciplines of the signature analysis process that need to be orchestrated within the organization: design for test practices, test floor data collection methodology, post-test data analysis tools, root cause theorization, and physical failure analysis strategies.
Cary A. Gloor, The Power of Semiconductor Memory Failure Signature Analysis, Microelectronics Failure Analysis: Desk Reference, 7th ed., Edited By Tejinder Gandhi, ASM International, 2019, p 506–512, https://doi.org/10.31399/asm.tb.mfadr7.t91110506
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New Handbook: Volume 11B
Now available in the Digital Library! Volume 11B serves as a reference and guide to help engineers determine the causes of failure in plastic components and make corrective adjustments through design and manufacturing modifications.