Characterization and Failure Analysis of Plastics
Abstract
This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass spectrometry. The principles of surface analysis and some of the applications of the technique in polymer failure studies are also provided.
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Member Sign InSurface Analysis, Characterization and Failure Analysis of Plastics, Edited By Steven Lampman, ASM International, 2003, p 383–403, https://doi.org/10.31399/asm.tb.cfap.t69780383
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