In x-ray diffraction residual stress measurement, the strain in the crystal lattice is measured, and the residual stress producing the strain is calculated, assuming a linear elastic distortion of the crystal lattice. This article provides a detailed account of the plane stress elastic model, and describes the most common methods of x-ray diffraction residual stress measurement, namely, single-angle and two angle techniques. It elaborates the major steps involved in x-ray diffraction residual stress measurement, explaining the possible sources of error in stress measurement. The article also outlines the applications of x-ray diffraction residual stress measurement with examples.
Paul S. Prevey, X-Ray Diffraction Residual Stress Techniques, Materials Characterization, Vol 10, Edited By Ruth E. Whan, ASM International, 1986, p 380–392, https://doi.org/10.31399/asm.hb.v10.a0001761
Download citation file: