Materials Characterization
Auger Electron Spectroscopy
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Published:1986
Abstract
This article describes the principles and applications of Auger electron spectroscopy (AES). It provides information on the instrumentation typically used in the AES, including an electron gun, an electron spectrometer, a secondary electron detector, and an ion gun. The article also describes experimental methods and limitations of the AES, including elemental detection sensitivity, electron beam artifacts, sample charging, spectral peak overlap, high vapor pressure samples, and sputtering artifacts.
A. Joshi, Auger Electron Spectroscopy, Materials Characterization, Vol 10, Edited By Ruth E. Whan, ASM International, 1986, p 549–567, https://doi.org/10.31399/asm.hb.v10.a0001770
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New Handbook: Volume 11B
Volume 11B serves as a reference and guide to help engineers determine the causes of failure in plastic components and make corrective adjustments through design and manufacturing modifications.