Crystallographic texture measurement and analysis is an important tool for correlating material properties with microstructural features. This article describes the general approach to quantifying crystallographic texture, namely, the collection of statistical data from grain measurements and subsequent analysis based on Euler plots (i.e., pole figures), orientation distribution functions, and stereographic projections. Using detailed illustrations and examples, it explains the significance of preferred crystallographic orientations and their influence on properties and material behavior. The article also discusses sample selection and preparation as well as the challenges and limitations of various methods.
Brent L. Adams, Crystallographic Texture Measurement and Analysis, Materials Characterization, Vol 10, Edited By Ruth E. Whan, ASM International, 1986, p 357–364, https://doi.org/10.31399/asm.hb.v10.a0001759
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