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ASM Handbook Archive
Materials Characterization
Edited by
Ruth E. Whan
Ruth E. Whan
Sandia National Laboratories
Search for other works by this author on:
ASM International
Volume
10
ISBN electronic:
978-1-62708-178-8
Publication date:
1986
Volume 10 addresses materials characterization from an engineering perspective, describing the capabilities and limitations of various analytical tools and what they reveal about the composition, structure, and state of engineering materials. It examines optical metallography, electron microscopy, diffraction, chromatography, spectroscopy, and chemical analysis. It also discusses sample requirements and imaging enhancement techniques and includes glossary and other reference information.
Materials Characterization
Edited by: Ruth E. Whan
https://doi.org/10.31399/asm.hb.v10.9781627081788
ISBN (electronic): 978-1-62708-178-8
Publisher: ASM International
Published: 1986
Download citation file:
Table of Contents
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IntroductionByRuth E. WhanRuth E. WhanSandia National LaboratoriesSearch for other works by this author on:
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Introduction to Materials CharacterizationView Chapter PDF LinkPDFByR.E. WhanR.E. WhanMaterials Characterization Department, Sandia National LaboratoriesSearch for other works by this author on:Published:01 January 1986
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How To Use the HandbookPDF LinkPDFByK.H. Eckelmeyer;K.H. EckelmeyerSandia National LaboratoriesSearch for other works by this author on:S.H. WeissmanS.H. WeissmanSandia National LaboratoriesSearch for other works by this author on:Published:01 January 1986
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Sampling
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SamplingView Chapter PDF LinkPDFByJohn K. Taylor;John K. TaylorCenter for Analytical Chemistry, National Bureau of StandardsSearch for other works by this author on:Byron KratochvilByron KratochvilDepartment of Chemistry, University of AlbertaSearch for other works by this author on:Published:01 January 1986
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Optical and X-Ray SpectroscopyByThomas M. NiemczykThomas M. NiemczykUniversity of New MexicoSearch for other works by this author on:
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Optical Emission SpectroscopyView Chapter PDF LinkPDFByPaul B. FarnsworthPaul B. FarnsworthDepartment of Chemistry, Brigham Young UniversitySearch for other works by this author on:Published:01 January 1986
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Inductively Coupled Plasma Atomic Emission SpectroscopyView Chapter PDF LinkPDFByLynda M. FairesLynda M. FairesAnalytical Chemistry Group, Los Alamos National LaboratorySearch for other works by this author on:Published:01 January 1986
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Atomic Absorption SpectrometryView Chapter PDF LinkPDFByDarryl D. SiemerDarryl D. SiemerWestinghouse Idaho Nuclear CompanySearch for other works by this author on:Published:01 January 1986
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Ultraviolet/Visible Absorption SpectroscopyView Chapter PDF LinkPDFByG. Dana BrabsonG. Dana BrabsonDepartment of Chemistry, University of New MexicoSearch for other works by this author on:Published:01 January 1986
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Molecular Fluorescence SpectroscopyView Chapter PDF LinkPDFByLinda B. McGownLinda B. McGownDepartment of Chemistry, Oklahoma State UniversitySearch for other works by this author on:Published:01 January 1986
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X-Ray SpectrometryView Chapter PDF LinkPDFByDonald E. LeydenDonald E. LeydenDepartment of Chemistry, Colorado State UniversitySearch for other works by this author on:Published:01 January 1986
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Particle-Induced X-Ray EmissionView Chapter PDF LinkPDFByThomas A. CahillThomas A. CahillCrocker Nuclear Laboratory, University of California—DavisSearch for other works by this author on:Published:01 January 1986
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Infrared SpectroscopyView Chapter PDF LinkPDFByCurtis MarcottCurtis MarcottThe Procter & Gamble Company, Miami Valley LaboratoriesSearch for other works by this author on:Published:01 January 1986
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Raman SpectroscopyView Chapter PDF LinkPDFByJeanne E. Pemberton;Jeanne E. PembertonDepartment of Chemistry, University of ArizonaSearch for other works by this author on:Anita L. GuyAnita L. GuyDepartment of Chemistry, University of ArizonaSearch for other works by this author on:Published:01 January 1986
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Mass SpectroscopyByJoel A. CarterJoel A. CarterOak Ridge National LaboratorySearch for other works by this author on:
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Spark Source Mass SpectrometryView Chapter PDF LinkPDFByJ.A. CarterJ.A. CarterOak Ridge National LaboratorySearch for other works by this author on:Published:01 January 1986
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Gas Analysis by Mass SpectrometryView Chapter PDF LinkPDFByJ.L. MarshallJ.L. MarshallOak Ridge Y-12 PlantSearch for other works by this author on:Published:01 January 1986
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Classical, Electrochemical, and Radiochemical AnalysisByDean A. Flinchbaugh;Dean A. FlinchbaughBethlehem Steel CorporationSearch for other works by this author on:Carolyn McCrory-JoyCarolyn McCrory-JoyAT&T Bell LaboratoriesSearch for other works by this author on:
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Classical Wet Analytical ChemistryView Chapter PDF LinkPDFByThomas R. DulskiThomas R. DulskiCarpenter Technology CorporationSearch for other works by this author on:Published:01 January 1986
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Potentiometric Membrane ElectrodesView Chapter PDF LinkPDFByMark A. ArnoldMark A. ArnoldDepartment of Chemistry, University of IowaSearch for other works by this author on:Published:01 January 1986
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VoltammetryView Chapter PDF LinkPDFByD.R. CrowD.R. CrowDepartment of Chemistry, The Polytechnic,Wolverhampton,EnglandSearch for other works by this author on:Published:01 January 1986
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Electrometric TitrationView Chapter PDF LinkPDFByJohn T. StockJohn T. StockDepartment of Chemistry, University of ConnecticutSearch for other works by this author on:Published:01 January 1986
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Controlled-Potential CoulometryView Chapter PDF LinkPDFByJackson E. HarrarJackson E. HarrarChemistry and Materials Science Department, Lawrence Livermore National LaboratorySearch for other works by this author on:Published:01 January 1986
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Elemental and Functional Group AnalysisView Chapter PDF LinkPDFByWalter T. Smith, Jr.Walter T. Smith, Jr.Department of Chemistry, University of KentuckySearch for other works by this author on:Published:01 January 1986
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High-Temperature CombustionView Chapter PDF LinkPDFPublished:01 January 1986
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Neutron Activation AnalysisView Chapter PDF LinkPDFByS.R. GarciaS.R. GarciaLos Alamos National LaboratorySearch for other works by this author on:Published:01 January 1986
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RadioanalysisView Chapter PDF LinkPDFByGeorge M. MatlackGeorge M. MatlackLos Alamos National LaboratorySearch for other works by this author on:Published:01 January 1986
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Resonance MethodsByLarry H. BennettLarry H. BennettNational Bureau of StandardsSearch for other works by this author on:
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Electron Spin ResonanceView Chapter PDF LinkPDFByCharles P. Poole, Jr.;Charles P. Poole, Jr.Department of Physics and Astronomy, University of South CarolinaSearch for other works by this author on:Horatio A. FarachHoratio A. FarachDepartment of Physics and Astronomy, University of South CarolinaSearch for other works by this author on:Published:01 January 1986
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Ferromagnetic ResonanceView Chapter PDF LinkPDFByS.M. BhagatS.M. BhagatDepartment of Physics and Astronomy, University of MarylandSearch for other works by this author on:Published:01 January 1986
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Nuclear Magnetic ResonanceView Chapter PDF LinkPDFByL.J. SwartzendruberL.J. SwartzendruberNational Bureau of StandardsSearch for other works by this author on:Published:01 January 1986
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Mössbauer SpectroscopyView Chapter PDF LinkPDFByL.J. Swartzendruber;L.J. SwartzendruberNational Bureau of StandardsSearch for other works by this author on:L.H. BennettL.H. BennettNational Bureau of StandardsSearch for other works by this author on:Published:01 January 1986
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Metallographic TechniquesByMacIntyre R. LouthanMacIntyre R. LouthanVirginia Polytechnic Institute and State UniversitySearch for other works by this author on:
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Optical MetallographyView Chapter PDF LinkPDFByM.R. Louthan, Jr.M.R. Louthan, Jr.Department of Materials Engineering, Virginia Polytechnic Institute and State UniversitySearch for other works by this author on:Published:01 January 1986
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Image AnalysisView Chapter PDF LinkPDFByGeorge F. Vander VoortGeorge F. Vander VoortCarpenter Technology CorporationSearch for other works by this author on:Published:01 January 1986
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Diffraction MethodsByRaymond P. Goehner;Raymond P. GoehnerSiemens CorporationSearch for other works by this author on:Monte C. NicholsMonte C. NicholsSandia National LaboratoriesSearch for other works by this author on:
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Introduction to Diffraction MethodsView Chapter PDF LinkPDFByDeane K. SmithDeane K. SmithDepartment of Geosciences, The Pennsylvania State UniversitySearch for other works by this author on:Published:01 January 1986
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X-Ray Powder DiffractionView Chapter PDF LinkPDFByRaymond P. Goehner;Raymond P. GoehnerSiemens CorporationSearch for other works by this author on:Monte C. NicholsMonte C. NicholsSandia National LaboratoriesSearch for other works by this author on:Published:01 January 1986
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Single-Crystal X-Ray DiffractionView Chapter PDF LinkPDFByRichard L. HarlowRichard L. HarlowE.I. DuPont de NemoursSearch for other works by this author on:Published:01 January 1986
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Crystallographic Texture Measurement and AnalysisView Chapter PDF LinkPDFByBrent L. AdamsBrent L. AdamsDepartment of Mechanical Engineering, Brigham Young UniversitySearch for other works by this author on:Published:01 January 1986
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X-Ray TopographyView Chapter PDF LinkPDFByRobert N. PangbornRobert N. PangbornDepartment of Engineering Science and Mechanics, The Pennsylvania State UniversitySearch for other works by this author on:Published:01 January 1986
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X-Ray Diffraction Residual Stress TechniquesView Chapter PDF LinkPDFByPaul S. PreveyPaul S. PreveyLambda Research, Inc.Search for other works by this author on:Published:01 January 1986
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Radial Distribution Function AnalysisView Chapter PDF LinkPDFByJ.H. Konnert;J.H. KonnertLaboratory for the Structure of Matter, Naval Research LaboratorySearch for other works by this author on:J. Karle;J. KarleLaboratory for the Structure of Matter, Naval Research LaboratorySearch for other works by this author on:P. D'AntonioP. D'AntonioLaboratory for the Structure of Matter, Naval Research LaboratorySearch for other works by this author on:Published:01 January 1986
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Small-Angle X-Ray and Neutron ScatteringView Chapter PDF LinkPDFByD.G. LeGrandD.G. LeGrandPolymer Physics and Engineering Branch, Corporate Research and Development, General Electric CompanySearch for other works by this author on:Published:01 January 1986
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Extended X-Ray Absorption Fine StructureView Chapter PDF LinkPDFByJoe WongJoe WongCorporate Research and Development, General Electric CompanySearch for other works by this author on:Published:01 January 1986
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Neutron DiffractionView Chapter PDF LinkPDFByW.B. Yelon;W.B. YelonUniversity of Missouri Research ReactorSearch for other works by this author on:F.K. Ross;F.K. RossUniversity of Missouri Research ReactorSearch for other works by this author on:A.D. KrawitzA.D. KrawitzDepartment of Mechanical and Aerospace Engineering, University of Missouri—ColumbiaSearch for other works by this author on:Published:01 January 1986
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Electron Optical MethodsByAlton D. Romig, Jr.Alton D. Romig, Jr.Sandia National LaboratoriesSearch for other works by this author on:
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Analytical Transmission Electron MicroscopyView Chapter PDF LinkPDFByA.D. Romig, Jr.A.D. Romig, Jr.Sandia National LaboratoriesSearch for other works by this author on:Published:01 January 1986
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Scanning Electron MicroscopyView Chapter PDF LinkPDFByJohn D. VerhoevenJohn D. VerhoevenDepartment of Metallurgy, Iowa State UniversitySearch for other works by this author on:Published:01 January 1986
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Electron Probe X-Ray MicroanalysisView Chapter PDF LinkPDFByKurt F.J. Heinrich;Kurt F.J. HeinrichNational Bureau of StandardsSearch for other works by this author on:Dale E. NewburyDale E. NewburyNational Bureau of StandardsSearch for other works by this author on:Published:01 January 1986
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Low-Energy Electron DiffractionView Chapter PDF LinkPDFByMax G. LagallyMax G. LagallyDepartment of Metallurgical and Mineral Engineering, University of WisconsinSearch for other works by this author on:Published:01 January 1986
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Electron or X-Ray Spectroscopic MethodsByHarris L. MarcusHarris L. MarcusUniversity of TexasSearch for other works by this author on:
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Auger Electron SpectroscopyView Chapter PDF LinkPDFByA. JoshiA. JoshiLockheed Palo Alto Research LaboratorySearch for other works by this author on:Published:01 January 1986
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X-Ray Photoelectron SpectroscopyView Chapter PDF LinkPDFByJ.B. LumsdenJ.B. LumsdenRockwell International Science CenterSearch for other works by this author on:Published:01 January 1986
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Methods Based on Sputtering or Scattering PhenomenaByJames A. BordersJames A. BordersSandia National LaboratoriesSearch for other works by this author on:
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Field Ion Microscopy and Atom Probe MicroanalysisView Chapter PDF LinkPDFByG.D.W. SmithG.D.W. SmithDepartment of Metallurgy and Science of Materials, University of OxfordSearch for other works by this author on:Published:01 January 1986
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Low-Energy Ion-Scattering SpectroscopyView Chapter PDF LinkPDFByG.C. NelsonG.C. NelsonSandia National LaboratoriesSearch for other works by this author on:Published:01 January 1986
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Secondary Ion Mass SpectroscopyView Chapter PDF LinkPDFByCarlo G. PantanoCarlo G. PantanoDepartment of Materials Science and Engineering, The Pennsylvania State UniversitySearch for other works by this author on:Published:01 January 1986
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Rutherford Backscattering SpectrometryView Chapter PDF LinkPDFByWei-Kan ChuWei-Kan ChuDepartment of Physics and Astronomy, University of North CarolinaSearch for other works by this author on:Published:01 January 1986
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Chromatography
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Gas Chromatography/Mass SpectrometryView Chapter PDF LinkPDFByLeo A. RaphaelianLeo A. RaphaelianChemical Technology Division, Argonne National LaboratorySearch for other works by this author on:Published:01 January 1986
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Liquid ChromatographyView Chapter PDF LinkPDFByMichael J. KellyMichael J. KellySandia National LaboratoriesSearch for other works by this author on:Published:01 January 1986
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Ion ChromatographyView Chapter PDF LinkPDFByRaymond M. MerrillRaymond M. MerrillSandia National LaboratoriesSearch for other works by this author on:Published:01 January 1986
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Reference Information
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Abbreviations and Symbols: Materials CharacterizationPublished:01 January 1986
