Introduction to Quantitative Fractography

The development of quantitative fractography (QF) parameters basically requires topological data of a fracture surface that can be derived from the stereological analysis of multiple projected scanning electron microscope (SEM) images; the profilometry-based techniques that measure the fracture surface profile along x-y sections of a fracture surface from metallographic sections or nondestructive techniques; and the three-dimensional reconstruction of the fracture surface topology using imaging methods such as stereo SEM imaging and confocal scanning laser microscopy. These three general methods of assessing fracture surface topology are reviewed in this article.