Scanning Electron Microscopy in Fractography
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Published:2024
Abstract
This article presumes the reader has a basic understanding of the operation and principles of scanning electron microscopy (SEM). The emphasis of this article is specifically on the application of SEM to the study of metallic and nonmetallic fracture surfaces, where the typical objectives of SEM examination of a fracture surface may include the following: identification of characteristic fracture features to aid in identifying fracture mechanism(s); characterization of material anomalies that may have influenced the fracture; qualitative or semiquantitative chemical analysis of component material(s); and qualitative or semiquantitative analysis of deposits or corrosion products on or near fracture surfaces.
Dan Grice, Scanning Electron Microscopy in Fractography, Fractography, Vol 12, ASM Handbook, Edited By Craig J. Schroeder, Ronald J. Parrington, Joseph O. Maciejewski, James F. Lane, ASM International, 2024, p 241–253, https://doi.org/10.31399/asm.hb.v12.a0006876
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