Imaging Methods for Fracture Surface Observation and Interpretation
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Published:2024
Abstract
This article presents a basic overview of technology-driven advances in the imaging of primarily metallic fracture surfaces. It describes various types of microscopes, including scanning electron, dual-beam, ion source, and transmission electron microscopes, and their capabilities. It also covers other useful hardware, such as computer-aided tomography (CAT) and micro-computer-aided tomography (micro-CAT) instruments. The article introduces some of the fracture image postprocessing methods and software, including image registration or alignment, focus stacking, Z-stacking, focal plane merging, and image stitching.
Simon A. Barter, Imaging Methods for Fracture Surface Observation and Interpretation, Fractography, Vol 12, ASM Handbook, Edited By Craig J. Schroeder, Ronald J. Parrington, Joseph O. Maciejewski, James F. Lane, ASM International, 2024, p 219–240, https://doi.org/10.31399/asm.hb.v12.a0006945
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