Abstract
The introduction of focused ion beam (FIB) microscopy in the 1990s added the capability of studying fracture surfaces in the third dimension and making site-specific and stress-free transmission electron microscope (TEM) specimens in situ. This article reviews the methods for preparing replicas and the site-specific FIB thin-foil preparation technique. It provides an overview of FIB-TEM specimen preparation.
Jian Li, Pei Liu, Transmission Electron Microscopy, Fractography, Vol 12, ASM Handbook, Edited By Craig J. Schroeder, Ronald J. Parrington, Joseph O. Maciejewski, James F. Lane, ASM International, 2024, p 1–11, https://doi.org/10.31399/asm.hb.v12.a0006847
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