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ASM Handbook Archive
Materials Characterization
Edited by
Ruth E. Whan
Ruth E. Whan
Sandia National Laboratories
Search for other works by this author on:
ASM International
Volume
10
ISBN electronic:
978-1-62708-178-8
Publication date:
1986
Volume 10 addresses materials characterization from an engineering perspective, describing the capabilities and limitations of various analytical tools and what they reveal about the composition, structure, and state of engineering materials. It examines optical metallography, electron microscopy, diffraction, chromatography, spectroscopy, and chemical analysis. It also discusses sample requirements and imaging enhancement techniques and includes glossary and other reference information.
Materials Characterization
Edited by: Ruth E. Whan
DOI: https://doi.org/10.31399/asm.hb.v10.9781627081788
ISBN (electronic): 978-1-62708-178-8
Publisher: ASM International
Published: 1986
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Table of Contents
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IntroductionByRuth E. WhanRuth E. WhanSandia National LaboratoriesSearch for other works by this author on:
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Introduction to Materials CharacterizationByR.E. WhanR.E. WhanMaterials Characterization Department, Sandia National LaboratoriesSearch for other works by this author on:
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How To Use the HandbookByK.H. Eckelmeyer;K.H. EckelmeyerSandia National LaboratoriesSearch for other works by this author on:S.H. WeissmanS.H. WeissmanSandia National LaboratoriesSearch for other works by this author on:
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Sampling
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SamplingByJohn K. Taylor;John K. TaylorCenter for Analytical Chemistry, National Bureau of StandardsSearch for other works by this author on:Byron KratochvilByron KratochvilDepartment of Chemistry, University of AlbertaSearch for other works by this author on:
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Optical and X-Ray SpectroscopyByThomas M. NiemczykThomas M. NiemczykUniversity of New MexicoSearch for other works by this author on:
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Optical Emission SpectroscopyByPaul B. FarnsworthPaul B. FarnsworthDepartment of Chemistry, Brigham Young UniversitySearch for other works by this author on:
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Inductively Coupled Plasma Atomic Emission SpectroscopyByLynda M. FairesLynda M. FairesAnalytical Chemistry Group, Los Alamos National LaboratorySearch for other works by this author on:
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Atomic Absorption SpectrometryByDarryl D. SiemerDarryl D. SiemerWestinghouse Idaho Nuclear CompanySearch for other works by this author on:
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Ultraviolet/Visible Absorption SpectroscopyByG. Dana BrabsonG. Dana BrabsonDepartment of Chemistry, University of New MexicoSearch for other works by this author on:
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Molecular Fluorescence SpectroscopyByLinda B. McGownLinda B. McGownDepartment of Chemistry, Oklahoma State UniversitySearch for other works by this author on:
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X-Ray SpectrometryByDonald E. LeydenDonald E. LeydenDepartment of Chemistry, Colorado State UniversitySearch for other works by this author on:
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Particle-Induced X-Ray EmissionByThomas A. CahillThomas A. CahillCrocker Nuclear Laboratory, University of California—DavisSearch for other works by this author on:
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Infrared SpectroscopyByCurtis MarcottCurtis MarcottThe Procter & Gamble Company, Miami Valley LaboratoriesSearch for other works by this author on:
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Raman SpectroscopyByJeanne E. Pemberton;Jeanne E. PembertonDepartment of Chemistry, University of ArizonaSearch for other works by this author on:Anita L. GuyAnita L. GuyDepartment of Chemistry, University of ArizonaSearch for other works by this author on:
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Mass SpectroscopyByJoel A. CarterJoel A. CarterOak Ridge National LaboratorySearch for other works by this author on:
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Spark Source Mass SpectrometryByJ.A. CarterJ.A. CarterOak Ridge National LaboratorySearch for other works by this author on:
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Gas Analysis by Mass SpectrometryByJ.L. MarshallJ.L. MarshallOak Ridge Y-12 PlantSearch for other works by this author on:
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Classical, Electrochemical, and Radiochemical AnalysisByDean A. Flinchbaugh;Dean A. FlinchbaughBethlehem Steel CorporationSearch for other works by this author on:Carolyn McCrory-JoyCarolyn McCrory-JoyAT&T Bell LaboratoriesSearch for other works by this author on:
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Classical Wet Analytical ChemistryByThomas R. DulskiThomas R. DulskiCarpenter Technology CorporationSearch for other works by this author on:
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Potentiometric Membrane ElectrodesByMark A. ArnoldMark A. ArnoldDepartment of Chemistry, University of IowaSearch for other works by this author on:
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VoltammetryByD.R. CrowD.R. CrowDepartment of Chemistry, The Polytechnic,Wolverhampton,EnglandSearch for other works by this author on:
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Electrometric TitrationByJohn T. StockJohn T. StockDepartment of Chemistry, University of ConnecticutSearch for other works by this author on:
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Controlled-Potential CoulometryByJackson E. HarrarJackson E. HarrarChemistry and Materials Science Department, Lawrence Livermore National LaboratorySearch for other works by this author on:
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Elemental and Functional Group AnalysisByWalter T. Smith, Jr.Walter T. Smith, Jr.Department of Chemistry, University of KentuckySearch for other works by this author on:
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Neutron Activation AnalysisByS.R. GarciaS.R. GarciaLos Alamos National LaboratorySearch for other works by this author on:
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RadioanalysisByGeorge M. MatlackGeorge M. MatlackLos Alamos National LaboratorySearch for other works by this author on:
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Resonance MethodsByLarry H. BennettLarry H. BennettNational Bureau of StandardsSearch for other works by this author on:
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Electron Spin ResonanceByCharles P. Poole, Jr.;Charles P. Poole, Jr.Department of Physics and Astronomy, University of South CarolinaSearch for other works by this author on:Horatio A. FarachHoratio A. FarachDepartment of Physics and Astronomy, University of South CarolinaSearch for other works by this author on:
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Ferromagnetic ResonanceByS.M. BhagatS.M. BhagatDepartment of Physics and Astronomy, University of MarylandSearch for other works by this author on:
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Nuclear Magnetic ResonanceByL.J. SwartzendruberL.J. SwartzendruberNational Bureau of StandardsSearch for other works by this author on:
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Mössbauer SpectroscopyByL.J. Swartzendruber;L.J. SwartzendruberNational Bureau of StandardsSearch for other works by this author on:L.H. BennettL.H. BennettNational Bureau of StandardsSearch for other works by this author on:
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Metallographic TechniquesByMacIntyre R. LouthanMacIntyre R. LouthanVirginia Polytechnic Institute and State UniversitySearch for other works by this author on:
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Optical MetallographyByM.R. Louthan, Jr.M.R. Louthan, Jr.Department of Materials Engineering, Virginia Polytechnic Institute and State UniversitySearch for other works by this author on:
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Image AnalysisByGeorge F. Vander VoortGeorge F. Vander VoortCarpenter Technology CorporationSearch for other works by this author on:
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Diffraction MethodsByRaymond P. Goehner;Raymond P. GoehnerSiemens CorporationSearch for other works by this author on:Monte C. NicholsMonte C. NicholsSandia National LaboratoriesSearch for other works by this author on:
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Introduction to Diffraction MethodsByDeane K. SmithDeane K. SmithDepartment of Geosciences, The Pennsylvania State UniversitySearch for other works by this author on:
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X-Ray Powder DiffractionByRaymond P. Goehner;Raymond P. GoehnerSiemens CorporationSearch for other works by this author on:Monte C. NicholsMonte C. NicholsSandia National LaboratoriesSearch for other works by this author on:
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Single-Crystal X-Ray DiffractionByRichard L. HarlowRichard L. HarlowE.I. DuPont de NemoursSearch for other works by this author on:
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Crystallographic Texture Measurement and AnalysisByBrent L. AdamsBrent L. AdamsDepartment of Mechanical Engineering, Brigham Young UniversitySearch for other works by this author on:
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X-Ray TopographyByRobert N. PangbornRobert N. PangbornDepartment of Engineering Science and Mechanics, The Pennsylvania State UniversitySearch for other works by this author on:
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X-Ray Diffraction Residual Stress TechniquesByPaul S. PreveyPaul S. PreveyLambda Research, Inc.Search for other works by this author on:
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Radial Distribution Function AnalysisByJ.H. Konnert;J.H. KonnertLaboratory for the Structure of Matter, Naval Research LaboratorySearch for other works by this author on:J. Karle;J. KarleLaboratory for the Structure of Matter, Naval Research LaboratorySearch for other works by this author on:P. D'AntonioP. D'AntonioLaboratory for the Structure of Matter, Naval Research LaboratorySearch for other works by this author on:
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Small-Angle X-Ray and Neutron ScatteringByD.G. LeGrandD.G. LeGrandPolymer Physics and Engineering Branch, Corporate Research and Development, General Electric CompanySearch for other works by this author on:
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Extended X-Ray Absorption Fine StructureByJoe WongJoe WongCorporate Research and Development, General Electric CompanySearch for other works by this author on:
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Neutron DiffractionByW.B. Yelon;W.B. YelonUniversity of Missouri Research ReactorSearch for other works by this author on:F.K. Ross;F.K. RossUniversity of Missouri Research ReactorSearch for other works by this author on:A.D. KrawitzA.D. KrawitzDepartment of Mechanical and Aerospace Engineering, University of Missouri—ColumbiaSearch for other works by this author on:
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Electron Optical MethodsByAlton D. Romig, Jr.Alton D. Romig, Jr.Sandia National LaboratoriesSearch for other works by this author on:
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Analytical Transmission Electron MicroscopyByA.D. Romig, Jr.A.D. Romig, Jr.Sandia National LaboratoriesSearch for other works by this author on:
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Scanning Electron MicroscopyByJohn D. VerhoevenJohn D. VerhoevenDepartment of Metallurgy, Iowa State UniversitySearch for other works by this author on:
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Electron Probe X-Ray MicroanalysisByKurt F.J. Heinrich;Kurt F.J. HeinrichNational Bureau of StandardsSearch for other works by this author on:Dale E. NewburyDale E. NewburyNational Bureau of StandardsSearch for other works by this author on:
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Low-Energy Electron DiffractionByMax G. LagallyMax G. LagallyDepartment of Metallurgical and Mineral Engineering, University of WisconsinSearch for other works by this author on:
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Electron or X-Ray Spectroscopic MethodsByHarris L. MarcusHarris L. MarcusUniversity of TexasSearch for other works by this author on:
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Auger Electron SpectroscopyByA. JoshiA. JoshiLockheed Palo Alto Research LaboratorySearch for other works by this author on:
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X-Ray Photoelectron SpectroscopyByJ.B. LumsdenJ.B. LumsdenRockwell International Science CenterSearch for other works by this author on:
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Methods Based on Sputtering or Scattering PhenomenaByJames A. BordersJames A. BordersSandia National LaboratoriesSearch for other works by this author on:
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Field Ion Microscopy and Atom Probe MicroanalysisByG.D.W. SmithG.D.W. SmithDepartment of Metallurgy and Science of Materials, University of OxfordSearch for other works by this author on:
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Low-Energy Ion-Scattering SpectroscopyByG.C. NelsonG.C. NelsonSandia National LaboratoriesSearch for other works by this author on:
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Secondary Ion Mass SpectroscopyByCarlo G. PantanoCarlo G. PantanoDepartment of Materials Science and Engineering, The Pennsylvania State UniversitySearch for other works by this author on:
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Rutherford Backscattering SpectrometryByWei-Kan ChuWei-Kan ChuDepartment of Physics and Astronomy, University of North CarolinaSearch for other works by this author on:
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Chromatography
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Gas Chromatography/Mass SpectrometryByLeo A. RaphaelianLeo A. RaphaelianChemical Technology Division, Argonne National LaboratorySearch for other works by this author on:
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Liquid ChromatographyByMichael J. KellyMichael J. KellySandia National LaboratoriesSearch for other works by this author on:
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Ion ChromatographyByRaymond M. MerrillRaymond M. MerrillSandia National LaboratoriesSearch for other works by this author on:
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Reference Information