Skip to Main Content
Skip Nav Destination

Abstract

This article is an atlas of fractographs that helps in understanding the causes and mechanisms of fracture of electronic materials, including L-shaped electronic flat pack, transistor base lead, ohmic contact window, and brush/slip ring assembly. The fractographs illustrate the atomic oxygen environment exposure effect, solar cell interconnect, integrated circuit defects, and fatigue failure of these materials.

You do not currently have access to this chapter.
Don't already have an account? Register

Electronic Materials: Atlas of Fractographs, Fractography, Vol 12, ASM Handbook, ASM International, 1987, p 481–488, https://doi.org/10.31399/asm.hb.v12.a0000631

Download citation file:


Close
Close Modal

or Create an Account

Close Modal
Close Modal