This article addresses problems, such as “in spec” dilemma and on-target key, associated with traditional approaches to quality. It discusses major robust design techniques, tools, and concepts, such as quality loss function, parameter design, tolerance design, signal-to noise ratio, technology development, and orthogonal arrays.
ASM Reference Publications Catalog
The Fall / Winter 2019-2020 Catalog features more than 200 products including new and upcoming releases, popular best sellers, digital databases, and journals. Save now with set sales.