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This article introduces the concepts of electron and light microscopy with some general features of imaging systems and the ideas of magnification, resolution, depth of field, depth of focus, and lens aberrations as they apply to simple and familiar light-optical systems. In addition, it describes the differences between electron and light in the context of their respective microscopy techniques.

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Peter J. Goodhew, John Humphreys, Richard Beanland, Light and Electron Microscopy, Metallography and Microstructures, Vol 9, ASM Handbook, Edited By George F. Vander Voort, ASM International, 2004, p 325–331,

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