Failure Analysis and Prevention
This article provides information on the chemical characterization of surfaces by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). It describes the basic theory behind each of these techniques, the types of data produced from each, and some typical applications. The article explains the strengths of AES, XPS, and TOF-SIMS based on data obtained from the surface of a slightly corroded stainless steel sheet.
John G. Newman, Chemical Characterization of Surfaces, Failure Analysis and Prevention, Vol 11, ASM Handbook, Edited By William T. Becker, Roch J. Shipley, ASM International, 2002, p 527–537, https://doi.org/10.31399/asm.hb.v11.a0003534
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