Skip to Main Content
Skip Nav Destination

Abstract

This article provides information on the chemical characterization of surfaces by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). It describes the basic theory behind each of these techniques, the types of data produced from each, and some typical applications. The article explains the strengths of AES, XPS, and TOF-SIMS based on data obtained from the surface of a slightly corroded stainless steel sheet.

You do not currently have access to this chapter.
Don't already have an account? Register

John G. Newman, Chemical Characterization of Surfaces, Failure Analysis and Prevention, Vol 11, ASM Handbook, Edited By William T. Becker, Roch J. Shipley, ASM International, 2002, p 527–537, https://doi.org/10.31399/asm.hb.v11.a0003534

Download citation file:


Close
Close Modal

or Create an Account

Close Modal
Close Modal