Credits
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Published:2019
Division Editors
Editor . | Division . |
---|---|
Thomas J. Bruno National Institute of Standards and Technology | Chemical Analysis and Separation Techniques |
Ryan Deacon United Technologies Research Center | Microscopy and Microanalysis (with Neil Magdefrau) |
Jeffrey A. Jansen The Madison Group | Thermal Analysis |
Neal Magdefrau Electron Microscropy Innovative Technologies | Microscopy and Microanalysis (with Ryan Deacon) |
Erik Mueller National Transportation Safety Board | X-Ray and Neutron Diffraction |
George F. Vander Voort Vander Voort Consulting L.L.C | Light Optical Microscopy |
Dehua Yang Ebatco | Surface Analysis |
List of Contributors
Rachel Anderson
Navy Research Lab
Juan Asensio-Lozano
Universidad de Oviedo
Nabil Bassim
McMaster University
Arne Bengtson
SWERIM AB
Bharat Bhushan
The Ohio State University
Thomas N. Blanton
International Centre for Diffraction Data
Nerea Bordel
University of Oviedo
Olaf J. Borkiewicz
Argonne National Laboratory
David Brown
St. John’s University
Thomas J. Bruno
Applied Chemicals and Materials Division
National Institute of Standards and Technology
John Cammett
Consultant
Bob Chaney
Service Physics Corporation
Patrick Chapon
Horiba Jobin Yvon S.A.S
Sumit Chaudhary
Exponent Inc.
Yu-Sheng Chen
The University of Chicago
Kenton Childs
Sandia National Laboratories
Richard E. Chinn
National Energy Technology Laboratory
Robert Chirico
Thermodynamics Research Center
National Institute of Standards and Technology
Wei-Kan Chu
University of Houston
Ryan Deacon
United Technologies Research Center
Tom Depover
Ghent University
Gary Doll
The University of Akron
Gregory P. Dooley
Colorado State University
António M. dos Santos
Oak Ridge National Laboratory
Michael Dudley
Stony Brook University
Giovanni Ferraris
Politecnico di Torino
Wesley Frey
UC Davis
Raymond S. Fuentes
Sandia National Laboratories
Oumaïma Gharbi
Sorbonne Université
Jim Gibson
EAG
Franz Giessibl
Universitat Regensburg
Cristina Gonzalez-Gago
University of Oviedo
Mark Goorsky
UCLA
Hugh E. Gotts
Air Liquide Electronics - Balazs NanoAnalysis
Vladislav V. Gurzhiy
St. Petersburg State University
BoYing Han
EAG Laboratories
Larry Hanke
Materials Evaluation and Engineering, Inc.
Megan Harries
National Institute of Standards and Technology
Andrew Anthony Havics
pH2 LLC
April A. Hill
Metropolitan State University of Denver
Odile Hirsch
Horiba Jobin Yvon S.A.S
Christina Hoffmann
Oak Ridge National Laboratory
Douglas J. Hornbach
Lambda Research, Inc.
Bo Hu
North American Hoganas, Inc.
Michael Janicke
Los Alamos National Laboratory
Jeffrey A. Jansen
The Madison Group
Russell L. Jarek
Sandia National Laboratories
N. Jayaraman
Lambda Technolgoies
Kavita M. Jeerage
Applied Chemicals and Materials Division
National Institute of Standards and Technology
A. Joshi
Advanced Technology Center, Lockheed Martin Space
Michael Kangas
Doane University
Vassili Karanassios
University of Waterloo
Martin Kasik
MK2 Technologies, Inc.
Yongchang Kim
Argonne National Laboratory
Tiffany L. Kinnibrugh
DeNovX
Melanie Kirkham
Oak Ridge National Laboratory
Petr Klapetek
Czech Metrology Institute
Takane Kobayashi
RIKEN
Mary Kosarzycki
Element Materials Technology
S. Lampman
ASM International
Saul H. Lapidus
Argonne National Laboratory
Matteo Leoni
University of Trento
International Centre for Diffraction Data
Saudi Aramco
Fuhe Li
Air Liquide Electronics - Balazs NanoAnalysis
Tara M. Lovestead
Applied Chemicals and Materials Division
National Institute of Standards and Technology
Sydney Luk
North American Hoganas, Inc.
Neil Magdefrau
Electron Microscopy Innovative Technologies
Curtis Marcott
Light Light Solutions, LLC
Patrick McKeown
EAG Laboratories
Dana Medlin
EAG Laboratories
Todd J. Menna
Element Materials Technology
Joseph R. Michael
Sandia National Laboratories
Curtis D. Mowry
Sandia National Laboratories
Erik Mueller
National Transportation Safety Board
Meredith S. Nevius
Exponent Inc.
Dale E. Newbury
National Institute of Standards and Technology
Reinhard Noll
Fraunhofer Institute for Laser Technology ILT
Gert Nolze
Bundesanstalt für Materialforschung und –prüfung, BAM
John Notte
Carl Zeiss SMT, Inc.
Lisa S. Ott
California State University, Chico
Binayak Panda
Marshall Space Flight Center / NASA
D.F. Paul
Physical Electronics USA
Yoosuf N. Picard
Carnegie Mellon University
Adam S. Pimentel
Sandia National Laboratories
Jorge Pisonero
University of Oviedo
Christopher A. Pohl
Thermo Fisher Scientific
Paul S. Prevey
Lambda Research, Inc.
Balaji Raghothamachar
Stony Brook University
Gary D. Rayson
New Mexico State University
Nicholas W. M. Ritchie
National Institute of Standards and Technology
Jessica Román-Kustas
Sandia National Laboratories
Bibhudutta Rout
University of North Texas
Richard Rucker
Exponent Inc.
Gregory Schmidt
Thermo Fisher Scientific
David T. Schoen
Exponent Inc.
Craig J. Schroeder
Element Materials Technology
Sven Schroeder
University of Leeds
Lin Shao
Texas A&M University
Paul Shiller
The University of Akron
Vince Smentkowski
GE Global Research
Deane K. Smith
The Pennsylvania State University
Alice Stankova
Horiba Jobin Yvon S.A.S
Fred Stevie
North Carolina State University
Kevin Stone
SLAC National Accelerator Laboratory
Paris Svoronos
Queensborough Community College-CUNY
Ian Swainsson
International Atomic Energy Agency
Jim Sydnor
JWS, Inc.
Agnieszka Szczotok
Silesian University of Technology
John Tartaglia
Element Materials Technology
Amber C. Telles
Sandia National Laboratories
Agnes Tempez
Horiba Jobin Yvon S.A.S.
Cristian Teodorescu
National Institute of Materials Physics
Brian Toby
Argonne National Laboratory, APS
Bryan E. Tomlin
Texas A&M University
Kenji Umezawa
Osaka Prefecture University
Kimberly N. Urness
Applied Chemicals and Materials Division
National Institute of Standards and Technology
George F. Vander Voort
Vander Voort Consulting L.L.C.
Cornel Venzago
Evonik Industries
Farooq Wahab
University of Texas at Arlington
Masashi Watanabe
Lehigh University
Paul West
AFMWorkshop
Kamila M. Wiaderek
Argonne National Laboratory
Leszek Wojnar
Politechnika Krakowska im Tadeusza Kosciuszki
Wenqian Xu
Argonne National Laboratory
Andrey Y. Yakovenko
Argonne National Laboratory
Dehua Yang
Ebatco
Randall E. Youngman
Corning Incorporated
Amirali Zangiabadi
Columbia University
Officers and Trustees of ASM International (2018–2019)
David U. Furrer
President
Pratt and Whitney
Zi-Kui Liu
Vice President
Pennsylvania State University
Frederick E. Schmidt
Immediate Past President
Advanced Applied Services
William T. Mahoney
Managing Director
ASM International
Raymond V. Fryan
Treasurer
TimkenSteel Corporation
Prem K. Aurora
Aurora Engineering Co.
Larry D. Hanke
Materials Evaluation and Engineering
Roger A. Jones
Solar Atmospheres Inc.
Diana Lados
Worcester Polytechnic Institute
Thomas M. Moore
Wavix Inc.
Jason Sebastian
Questek Innovations, LLC
Larry Somrack
NSL Analytical Services, Inc.
Judith A. Todd
The Pennsylvania State University
John D. Wolodko
University of Alberta
Student Board Members
Aadithya Jeyaranjan
University of Central Florida
Kenna Ritter
University of Connecticut
Eli Vandersluis
Ryerson University
Members of the ASM Handbook Committee (2018–2019)
Alan P. Druschitz, Chair
Virginia Tech
Craig J. Schroeder, Vice Chair
Element
George Vander Voort, Immediate Past Chair
Vander Voort Consulting L.L.C.
Jason Sebastian, Board Liaison
Questek Innovations LLC
Sabit Ali
AVIVA Metals
Kevin R. Anderson
Mercury Marine
Scott Beckwith
BTG Composites Inc.
Narendra B. Dahotre
University of North Texas
Martin Jones
Ford Motor Company
Dana Medlin
EAG Laboratories, Inc.
Erik M. Mueller
National Transportation Safety Board
Roger Narayan
UNC-NCSU Dept of Biomed Eng
Scott M. Olig
US Naval Research Lab
Valery Rudnev
Inductoheat Incorporated
Muthukumarasamy Sadayappan
National Resources Canada
Satyam Suraj Sahay
John Deere Technology Center India
Jeffery S. Smith
Material Processing Technology LLC
John M. Tartaglia
Element Materials Technology Wixom Inc.
George E. Totten
G.E. Totten & Associates LLC
Junsheng Wang
Beijing Institute of Technology
Valerie L. Wiesner
NASA Glenn Research Center
Dehua Yang
Ebatco
Joseph Newkirk
Ex-Officio member
Missouri University of Science and Technology
Chairs of the ASM Handbook Committee
J.F. Harper
(1923–1926) (Member 1923–1926)
W.J. Merten
(1927–1930) (Member 1923–1933)
L.B. Case
(1931–1933) (Member 1927–1933)
C.H. Herty, Jr.
(1934–1936) (Member 1930–1936)
J.P. Gill
(1937) (Member 1934–1937)
R.L. Dowdell
(1938–1939) (Member 1935–1939)
G.V. Luerssen
(1943–1947) (Member 1942–1947)
J.B. Johnson
(1948–1951) (Member 1944–1951)
E.O. Dixon
(1952–1954) (Member 1947–1955)
N.E. Promisel
(1955–1961) (Member 1954–1963)
R.W.E. Leiter
(1962–1963) (Member 1955–1958, 1960–1964)
D.J. Wright
(1964–1965) (Member 1959–1967)
J.D. Graham
(1966–1968) (Member 1961–1970)
W.A. Stadtler
(1969–1972) (Member 1962–1972)
G.J. Shubat
(1973–1975) (Member 1966–1975)
R. Ward
(1976–1978) (Member 1972–1978)
G.N. Maniar
(1979–1980) (Member 1974–1980)
M.G.H. Wells
(1981) (Member 1976–1981)
J.L. McCall
(1982) (Member 1977–1982)
L.J. Korb
(1983) (Member 1978–1983)
T.D. Cooper
(1984–1986) (Member 1981–1986)
D.D. Huffman
(1986–1990) (Member 1982–1991)
D.L. Olson
(1990–1992) (Member 1982–1992)
R.J. Austin
(1992–1994) (Member 1984–1985)
W.L. Mankins
(1994–1997) (Member 1989–1998)
M.M. Gauthier
(1997–1998) (Member 1990–2000)
C.V. Darragh
(1999–2002) (Member 1989–2002)
Henry E. Fairman
(2002–2004) (Member 1993–2006)
Jeffrey A. Hawk
(2004–2006) (Member 1997–2008)
Larry D. Hanke
(2006–2008) (Member 1994–2012)
Kent L. Johnson
(2008–2010) (Member 1999–2014)
Craig D. Clauser
(2010–2012) (Member 2005–2016)
Joseph W. Newkirk
(2012–2014) (Member 2005–)
George Vander Voort
(2014–2016) (Member 1997–)
Alan P. Druschitz
(2016–present) (Member 2009–)
Staff
ASM International staff who contributed to the development of the Volume included Victoria Burt, Content Developer; Steve Lampman, Senior Content Developer; Amy Nolan, Content Developer; Susan Sellers, Content Developer; Madrid Tramble, Manager of Production; Vincent Katona, Production Coordinator; Jennifer Kelly, Production Coordinator; Karen Marken, Senior Managing Editor; and Scott D. Henry, Senior Content Engineer. Editorial Assistance was provided by Ed Kubel, Elizabeth Marquard, and Lilla Ryan.
Credits, Materials Characterization, Vol 10, 2019 ed., ASM Handbook, ASM International, 2019
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