Skip Nav Destination
ASM INTERNATIONAL
View Catalog
>
ASM Handbook
Materials Characterization (2019 Edition)
ASM International
Volume
10
ISBN electronic:
978-1-62708-213-6
Publication date:
2019
Book Chapter
Introduction to Scanning Probe Microscopy
By
Bharat Bhushan
Bharat Bhushan
The Ohio State University
Search for other works by this author on:
-
Published:2019
Abstract
This article provides an overview of scanning probe microscopes (scanning tunneling microscope and atomic force microscope (AFM)), covering the various operating modes and probes used in these instruments and providing information on AFM instrumentation, applications, and analyses.
You do not currently have access to this chapter.
Sign in
Don't already have an account? Register
You could not be signed in. Please check your email address / username and password and try again.
ASM members
Member Sign InCitation
Bharat Bhushan, Introduction to Scanning Probe Microscopy, Materials Characterization, Vol 10, 2019 ed., ASM Handbook, ASM International, 2019, p 709–724, https://doi.org/10.31399/asm.hb.v10.a0006633
Download citation file:
ASM INTERNATIONAL
FALL / WINTER 2020 CATALOG
View the new, upcoming, and best-selling resources in ASM Handbooks, technical books, and databases in the Fall / Winter 2020 Catalog.
Related Book Content
Evaluation of Environmentally Assisted Crack Growth
Mechanical Testing and Evaluation
Introduction to Surface Analysis
Materials Characterization (2019 Edition)
