This article is an overview of the division Surface Analysis of this volume. The division covers various developed surface-analysis techniques, such as scanning probe and atomic force microscopy. The division focuses on the analysis of surface layers that are less than 100 nm. A quick reference summary of surface-analysis methods is presented in this article.
Dehua Yang, Introduction to Surface Analysis, Materials Characterization, Vol 10, 2019 ed., ASM Handbook, ASM International, 2019, p 673–674, https://doi.org/10.31399/asm.hb.v10.a0006675
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