X-ray topography is the general term for a family of x-ray diffraction imaging techniques capable of providing information on the nature and distribution of imperfections. This article provides a detailed account of x-ray topography techniques, providing information on the historical background and development trends in x-ray diffraction topography. The discussion covers the general principles, components of systems, and applications of x-ray topography techniques, namely conventional X-ray topographic techniques and synchrotron x-ray topographic techniques.
Balaji Raghothamachar, Michael Dudley, X-Ray Topography, Materials Characterization, Vol 10, 2019 ed., ASM Handbook, ASM International, 2019, p 459–477, https://doi.org/10.31399/asm.hb.v10.a0006644
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