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Abstract

This article provides a detailed account of x-ray diffraction (XRD) residual-stress techniques. It begins by describing the principles of XRD stress measurement, followed by a discussion on the most common methods of XRD residual-stress measurement. Some of the procedures required for XRD residual-stress measurement are then presented. The article provides information on measurement of subsurface stress gradients and stress relaxation caused by layer removal. The article concludes with a section on examples of applications of XRD residual-stress measurement that are typical of industrial metallurgical, process development, and failure analysis investigations undertaken at Lambda Research.

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Paul S. Prevéy, Douglas J. Hornbach, X-Ray Diffraction Residual-Stress Techniques, Materials Characterization, Vol 10, 2019 ed., ASM Handbook, ASM International, 2019, p 440–458, https://doi.org/10.31399/asm.hb.v10.a0006632

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