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ASM Handbook
Materials Characterization (2019 Edition)
ASM International
Volume
10
ISBN electronic:
978-1-62708-213-6
Publication date:
2019
Book Chapter
Micro X-Ray Diffraction
By
Thomas N. Blanton
;
Thomas N. Blanton
International Centre for Diffraction Data
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Gregory Schmidt
Gregory Schmidt
Thermo Fisher Scientific
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-
Published:2019
Page range:
427 - 439
Abstract
This article discusses various concepts of micro x-ray diffraction (XRD) used for the examination of materials in situ. The discussion covers the principles, equipment used, sample preparation procedure, considerations for calibrating a detector, steps for performing data analysis, and applications and interpretation of micro-XRD.
Topics
Micro-beam X-ray diffraction
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Citation
Thomas N. Blanton, Gregory Schmidt, Micro X-Ray Diffraction, Materials Characterization, Vol 10, 2019 ed., ASM Handbook, ASM International, 2019, p 427–439, https://doi.org/10.31399/asm.hb.v10.a0006656
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