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ASM Handbook
Materials Characterization (2019 Edition)
ASM International
Volume
10
ISBN electronic:
978-1-62708-213-6
Publication date:
2019
Book Chapter
Introduction to Diffraction Methods
By
Matteo Leoni
Matteo Leoni
University of Trento, International Centre for Diffraction Data, and Saudi Aramco
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Published:2019
Page range:
389 - 398
Abstract
This article describes the methods of X-ray diffraction analysis, the types of information that can be obtained, and its interpretation. The discussion covers the basic theories of X-rays and various types of diffraction experiments, namely single-crystal methods for polychromatic and monochromatic beams, powder diffraction methods, and the Rietveld method.
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Citation
Matteo Leoni, Introduction to Diffraction Methods, Materials Characterization, Vol 10, 2019 ed., ASM Handbook, ASM International, 2019, p 389–398, https://doi.org/10.31399/asm.hb.v10.a0006643
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