Particle-Induced X-Ray Emission
This article provides a detailed account of particle-induced x-ray emission (PIXE), covering the basic principles of PIXE analysis and calibration and quality-assurance protocols employed. A comparative study on PIXE and x-ray fluorescence is then presented. The article also discusses the applications of PIXE in atmospheric physics and chemistry, external proton milliprobes and historical analysis, and PIXE microprobes.
FALL / WINTER 2020 CATALOG
View the new, upcoming, and best-selling resources in ASM Handbooks, technical books, and databases in the Fall / Winter 2020 Catalog.