Extended X-Ray Absorption Fine Structure
This article provides a detailed account of extended x-ray absorption fine structure (EXAFS). It begins with a description of the fundamentals of EXAFS, providing information on the physical mechanism, single-scattering approximation, and multiple-scattering effects. This is followed by a discussion on the use of synchrotron radiation as an X-ray source for EXAFS. Data-reduction procedures used to extract EXAFS signals are then described. The article also provides information on the analysis of x-ray absorption near-edge structure spectrum and ends with a discussion on the unique features and applications of EXAFS.
ASM Reference Publications Catalog
The Fall / Winter 2019-2020 Catalog features more than 200 products including new and upcoming releases, popular best sellers, digital databases, and journals. Save now with set sales.