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Abstract

This article introduces various techniques commonly used in the characterization of semiconductors, namely single-crystal, polycrystalline, amorphous, oxide, organic, and low-dimensional semiconductors and semiconductor devices. The discussion covers material classification, fabrication methods, sample preparation, bulk/elemental characterization methods, microstructural characterization methods, surface characterization methods, and electronic characterization methods.

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David T. Schoen, Meredith S. Nevius, Sumit Chaudhary, 2019. "Semiconductor Characterization", Materials Characterization

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