Materials Characterization (2019 Edition)
The 2019 edition of ASM Handbook, Volume 10: Materials Characterization provides detailed technical information that will enable readers to select and use analytical techniques that are appropriate for their problem. Each article describing a characterization technique begins with an overview of the method in simplified terms and lists common applications as well as limitations. Sample size, form, and special preparation requirements are listed upfront to help readers quickly decide if the techniques are appropriate to solve their problem. Tables and charts listing the most common characterization methods for different classes of materials are included in the beginning of the handbook. The tables give information on whether the technique is suitable for elemental analysis, qualitative analysis, surface analysis, or alloy verification. The articles also describe material characterization in general terms according to material type and serve as a jumping off point to the more specific technique articles. For information on the print version of Volume 10, ISBN 978-1-62708-211-2, follow this link.
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Table of Contents
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Introduction to Material Analysis Methods
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Introduction to Characterization of PowdersByBo HuBo HuNorth American Hoganas, Inc.Search for other works by this author on:
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Spectroscopy
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Atomic Absorption SpectroscopyByGary D. RaysonGary D. RaysonNew Mexico State UniversitySearch for other works by this author on:
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Inductively Coupled Plasma Optical Emission SpectroscopyByAlice StankovaAlice StankovaHoriba Jobin Yvon S.A.S.Search for other works by this author on:
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Infrared SpectroscopyByCurtis MarcottCurtis MarcottLight Light Solutions, LLCSearch for other works by this author on:
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Nuclear Magnetic ResonanceByRandall E. YoungmanRandall E. YoungmanCorning IncorporatedSearch for other works by this author on:
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Mass and Ion Spectrometry
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Solid Analysis by Mass SpectrometryByJessica Román-Kustas;Jessica Román-KustasSandia National LaboratoriesSearch for other works by this author on:Raymond S. Fuentes;Raymond S. FuentesSandia National LaboratoriesSearch for other works by this author on:Curtis D. MowryCurtis D. MowrySandia National LaboratoriesSearch for other works by this author on:
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Gas Analysis by Mass SpectrometryByCurtis D. Mowry;Curtis D. MowrySandia National LaboratoriesSearch for other works by this author on:Russell L. Jarek;Russell L. JarekSandia National LaboratoriesSearch for other works by this author on:Jessica Román-Kustas;Jessica Román-KustasSandia National LaboratoriesSearch for other works by this author on:Amber C. Telles;Amber C. TellesSandia National LaboratoriesSearch for other works by this author on:Adam S. PimentelAdam S. PimentelSandia National LaboratoriesSearch for other works by this author on:
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Glow Discharge Mass SpectrometryByCristina Gonzalez-Gago;Cristina Gonzalez-GagoUniversity of OviedoSearch for other works by this author on:Jorge PisoneroJorge PisoneroUniversity of OviedoSearch for other works by this author on:
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Inductively Coupled Plasma Mass SpectrometryByFuhe Li;Fuhe LiAir Liquide Electronics—Balazs NanoAnalysisSearch for other works by this author on:Hugh E. GottsHugh E. GottsAir Liquide Electronics—Balazs NanoAnalysisSearch for other works by this author on:
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Rutherford Backscattering SpectrometryByWei-Kan ChuWei-Kan ChuUniversity of HoustonSearch for other works by this author on:
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Low-Energy Ion-Scattering SpectroscopyByKenji UmezawaKenji UmezawaOsaka Prefecture UniversitySearch for other works by this author on:
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Chemical Analysis and Separation Techniques
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Calibration and Experimental Uncertainty[1]ByThomas J. BrunoThomas J. BrunoNational Institute of Standards and TechnologySearch for other works by this author on:
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Chemical Spot Tests and Presumptive TestsByApril A. HillApril A. HillMetropolitan State University of DenverSearch for other works by this author on:
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Classical Wet Analytical ChemistryByLisa S. OttLisa S. OttCalifornia State University, ChicoSearch for other works by this author on:
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Gas Chromatography[1]ByTara M. LovesteadTara M. LovesteadNational Institute of Standards and TechnologySearch for other works by this author on:
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Gas Chromatography/Mass Spectrometry[1]ByTara M. Lovestead;Tara M. LovesteadNational Institute of Standards and TechnologySearch for other works by this author on:Kimberly N. UrnessKimberly N. UrnessNational Institute of Standards and TechnologySearch for other works by this author on:
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Liquid ChromatographyByKavita M. Jeerage;Kavita M. JeerageNational Institute of Standards and TechnologySearch for other works by this author on:Gregory P. DooleyGregory P. DooleyColorado State UniversitySearch for other works by this author on:
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Ion ChromatographyByChristopher A. PohlChristopher A. PohlThermo Fisher ScientificSearch for other works by this author on:
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Electrochemical Methods[1]ByParis SvoronosParis SvoronosQueensborough Community CollegeSearch for other works by this author on:
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Neutron Activation Analysis[1]ByBryan E. TomlinBryan E. TomlinRevising authorTexas A&M UniversitySearch for other works by this author on:
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Thermal Analysis
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Differential Scanning Calorimetry[1]ByVictoria BurtVictoria BurtRevising authorASM InternationalSearch for other works by this author on:
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Thermomechanical AnalysisByRichard E. ChinnRichard E. ChinnNational Energy Technology LaboratorySearch for other works by this author on:
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X-Ray Analysis
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X-Ray Spectroscopy[1]ByS. LampmanS. LampmanRevising authorASM InternationalSearch for other works by this author on:
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X-Ray and Neutron Diffraction
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Introduction to Diffraction MethodsByMatteo LeoniMatteo LeoniUniversity of Trento, International Centre for Diffraction Data, and Saudi AramcoSearch for other works by this author on:
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X-Ray Powder Diffraction[1]ByMatteo LeoniMatteo LeoniUniversity of Trento, International Centre for Diffraction Data, and Saudi AramcoSearch for other works by this author on:
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Single-Crystal X-Ray DiffractionByVladislav V. GurzhiyVladislav V. GurzhiySt. Petersburg State UniversitySearch for other works by this author on:
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Micro X-Ray DiffractionByThomas N. Blanton;Thomas N. BlantonInternational Centre for Diffraction DataSearch for other works by this author on:Gregory SchmidtGregory SchmidtThermo Fisher ScientificSearch for other works by this author on:
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X-Ray Diffraction Residual-Stress TechniquesByDouglas J. HornbachDouglas J. HornbachLambda Research, Inc.Search for other works by this author on:
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X-Ray TopographyByBalaji Raghothamachar;Balaji RaghothamacharStony Brook UniversitySearch for other works by this author on:Michael DudleyMichael DudleyStony Brook UniversitySearch for other works by this author on:
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Synchrotron X-Ray Diffraction ApplicationsBySaul H. Lapidus;Saul H. LapidusArgonne National LaboratorySearch for other works by this author on:Andrey Y. Yakovenko;Andrey Y. YakovenkoArgonne National LaboratorySearch for other works by this author on:Youngchang Kim;Youngchang KimArgonne National LaboratorySearch for other works by this author on:Olaf J. Borkiewicz;Olaf J. BorkiewiczArgonne National LaboratorySearch for other works by this author on:Kamila M. Wiaderek;Kamila M. WiaderekArgonne National LaboratorySearch for other works by this author on:
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Neutron DiffractionByAntónio M. dos Santos;António M. dos SantosOak Ridge National LaboratorySearch for other works by this author on:Melanie Kirkham;Melanie KirkhamOak Ridge National LaboratorySearch for other works by this author on:Christina HoffmannChristina HoffmannOak Ridge National LaboratorySearch for other works by this author on:
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Light Optical Micrography
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Light Optical MetallographyByGeorge F. Vander VoortGeorge F. Vander VoortVander Voort Consulting L.L.C.Search for other works by this author on:
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Quantitative MetallographyByGeorge F. Vander VoortGeorge F. Vander VoortVander Voort Consulting L.L.C.Search for other works by this author on:
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Microscopy and Microanalysis
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Scanning Electron MicroscopyByYoosuf N. PicardYoosuf N. PicardCarnegie Mellon UniversitySearch for other works by this author on:
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Crystallographic Analysis by Electron Backscatter Diffraction in the Scanning Electron MicroscopeByJoseph R. MichaelJoseph R. MichaelSandia National LaboratoriesSearch for other works by this author on:
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Transmission Electron MicroscopyByMasashi WatanabeMasashi WatanabeLehigh UniversitySearch for other works by this author on:
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Electron Probe X-Ray MicroanalysisByDale E. Newbury;Dale E. NewburyNational Institute of Standards and TechnologySearch for other works by this author on:Nicholas W. M. RitchieNicholas W. M. RitchieNational Institute of Standards and TechnologySearch for other works by this author on:
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Surface Analysis
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Auger Electron Spectroscopy
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Low-Energy Electron DiffractionByAmirali ZangiabadiAmirali ZangiabadiRevising authorColumbia UniversitySearch for other works by this author on:
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Introduction to Scanning Probe MicroscopyByBharat BhushanBharat BhushanThe Ohio State UniversitySearch for other works by this author on:
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X-Ray Photoelectron Spectroscopy[1]ByBinayak PandaBinayak PandaNASA Marshall Space Flight CenterSearch for other works by this author on:
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Thermal Desorption SpectroscopyByPaul J. ShillerPaul J. ShillerThe University of AkronSearch for other works by this author on:
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