Materials Characterization (2019 Edition)
The 2019 edition of ASM Handbook, Volume 10: Materials Characterization provides detailed technical information that will enable readers to select and use analytical techniques that are appropriate for their problem. Each article describing a characterization technique begins with an overview of the method in simplified terms and lists common applications as well as limitations. Sample size, form, and special preparation requirements are listed upfront to help readers quickly decide if the techniques are appropriate to solve their problem. Tables and charts listing the most common characterization methods for different classes of materials are included in the beginning of the handbook. The tables give information on whether the technique is suitable for elemental analysis, qualitative analysis, surface analysis, or alloy verification. The articles also describe material characterization in general terms according to material type and serve as a jumping off point to the more specific technique articles. For information on the print version of Volume 10, ISBN 978-1-62708-211-2, follow this link.
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Table of Contents
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Introduction to Material Analysis Methods
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Semiconductor CharacterizationPublished:15 December 2019
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Introduction to Characterization of Organic Solids and Organic LiquidsPublished:15 December 2019
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Introduction to Characterization of PowdersByBo HuBo HuNorth American Hoganas, Inc.Search for other works by this author on:Published:15 December 2019
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Spectroscopy
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Atomic Absorption SpectroscopyByGary D. RaysonGary D. RaysonNew Mexico State UniversitySearch for other works by this author on:Published:15 December 2019
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Inductively Coupled Plasma Optical Emission SpectroscopyByAlice StankovaAlice StankovaHoriba Jobin Yvon S.A.S.Search for other works by this author on:Published:15 December 2019
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Infrared SpectroscopyByCurtis MarcottCurtis MarcottLight Light Solutions, LLCSearch for other works by this author on:Published:15 December 2019
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Nuclear Magnetic ResonanceByRandall E. YoungmanRandall E. YoungmanCorning IncorporatedSearch for other works by this author on:Published:15 December 2019
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Mass and Ion Spectrometry
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Solid Analysis by Mass SpectrometryByJessica Román-Kustas;Jessica Román-KustasSandia National LaboratoriesSearch for other works by this author on:Raymond S. Fuentes;Raymond S. FuentesSandia National LaboratoriesSearch for other works by this author on:Curtis D. MowryCurtis D. MowrySandia National LaboratoriesSearch for other works by this author on:Published:15 December 2019
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Gas Analysis by Mass SpectrometryByCurtis D. Mowry;Curtis D. MowrySandia National LaboratoriesSearch for other works by this author on:Russell L. Jarek;Russell L. JarekSandia National LaboratoriesSearch for other works by this author on:Jessica Román-Kustas;Jessica Román-KustasSandia National LaboratoriesSearch for other works by this author on:Amber C. Telles;Amber C. TellesSandia National LaboratoriesSearch for other works by this author on:Adam S. PimentelAdam S. PimentelSandia National LaboratoriesSearch for other works by this author on:Published:15 December 2019
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Glow Discharge Mass SpectrometryByCristina Gonzalez-Gago;Cristina Gonzalez-GagoUniversity of OviedoSearch for other works by this author on:Jorge PisoneroJorge PisoneroUniversity of OviedoSearch for other works by this author on:Published:15 December 2019
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Inductively Coupled Plasma Mass SpectrometryByFuhe Li;Fuhe LiAir Liquide Electronics—Balazs NanoAnalysisSearch for other works by this author on:Hugh E. GottsHugh E. GottsAir Liquide Electronics—Balazs NanoAnalysisSearch for other works by this author on:Published:15 December 2019
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Rutherford Backscattering SpectrometryByWei-Kan ChuWei-Kan ChuUniversity of HoustonSearch for other works by this author on:Published:15 December 2019
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Low-Energy Ion-Scattering SpectroscopyByKenji UmezawaKenji UmezawaOsaka Prefecture UniversitySearch for other works by this author on:Published:15 December 2019
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Chemical Analysis and Separation Techniques
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Calibration and Experimental Uncertainty[1]ByThomas J. BrunoThomas J. BrunoNational Institute of Standards and TechnologySearch for other works by this author on:Published:15 December 2019
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Chemical Spot Tests and Presumptive TestsByApril A. HillApril A. HillMetropolitan State University of DenverSearch for other works by this author on:Published:15 December 2019
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Classical Wet Analytical ChemistryByLisa S. OttLisa S. OttCalifornia State University, ChicoSearch for other works by this author on:Published:15 December 2019
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Gas Chromatography[1]ByTara M. LovesteadTara M. LovesteadNational Institute of Standards and TechnologySearch for other works by this author on:Published:15 December 2019
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Gas Chromatography/Mass Spectrometry[1]ByTara M. Lovestead;Tara M. LovesteadNational Institute of Standards and TechnologySearch for other works by this author on:Kimberly N. UrnessKimberly N. UrnessNational Institute of Standards and TechnologySearch for other works by this author on:Published:15 December 2019
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Liquid ChromatographyByKavita M. Jeerage;Kavita M. JeerageNational Institute of Standards and TechnologySearch for other works by this author on:Gregory P. DooleyGregory P. DooleyColorado State UniversitySearch for other works by this author on:Published:15 December 2019
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Ion ChromatographyByChristopher A. PohlChristopher A. PohlThermo Fisher ScientificSearch for other works by this author on:Published:15 December 2019
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Electrochemical Methods[1]ByParis SvoronosParis SvoronosQueensborough Community CollegeSearch for other works by this author on:Published:15 December 2019
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Neutron Activation Analysis[1]ByBryan E. TomlinBryan E. TomlinTexas A&M University
Revising author
Search for other works by this author on:Published:15 December 2019
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Thermal Analysis
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Differential Scanning Calorimetry[1]ByVictoria BurtVictoria BurtASM International
Revising author
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Thermomechanical AnalysisByRichard E. ChinnRichard E. ChinnNational Energy Technology LaboratorySearch for other works by this author on:Published:15 December 2019
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X-Ray Analysis
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X-Ray Spectroscopy[1]ByS. LampmanS. LampmanASM International
Revising author
Search for other works by this author on:Published:15 December 2019
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X-Ray and Neutron Diffraction
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Introduction to Diffraction MethodsByMatteo LeoniMatteo LeoniUniversity of Trento, International Centre for Diffraction Data, and Saudi AramcoSearch for other works by this author on:Published:15 December 2019
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X-Ray Powder Diffraction[1]ByMatteo LeoniMatteo LeoniUniversity of Trento, International Centre for Diffraction Data, and Saudi AramcoSearch for other works by this author on:Published:15 December 2019
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Single-Crystal X-Ray DiffractionByVladislav V. GurzhiyVladislav V. GurzhiySt. Petersburg State UniversitySearch for other works by this author on:Published:15 December 2019
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Micro X-Ray DiffractionByThomas N. Blanton;Thomas N. BlantonInternational Centre for Diffraction DataSearch for other works by this author on:Gregory SchmidtGregory SchmidtThermo Fisher ScientificSearch for other works by this author on:Published:15 December 2019
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X-Ray Diffraction Residual-Stress TechniquesByDouglas J. HornbachDouglas J. HornbachLambda Research, Inc.Search for other works by this author on:Published:15 December 2019
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X-Ray TopographyByBalaji Raghothamachar;Balaji RaghothamacharStony Brook UniversitySearch for other works by this author on:Michael DudleyMichael DudleyStony Brook UniversitySearch for other works by this author on:Published:15 December 2019
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Synchrotron X-Ray Diffraction ApplicationsBySaul H. Lapidus;Saul H. LapidusArgonne National LaboratorySearch for other works by this author on:Andrey Y. Yakovenko;Andrey Y. YakovenkoArgonne National LaboratorySearch for other works by this author on:Youngchang Kim;Youngchang KimArgonne National LaboratorySearch for other works by this author on:Olaf J. Borkiewicz;Olaf J. BorkiewiczArgonne National LaboratorySearch for other works by this author on:Kamila M. Wiaderek;Kamila M. WiaderekArgonne National LaboratorySearch for other works by this author on:Published:15 December 2019
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Neutron DiffractionByAntónio M. dos Santos;António M. dos SantosOak Ridge National LaboratorySearch for other works by this author on:Melanie Kirkham;Melanie KirkhamOak Ridge National LaboratorySearch for other works by this author on:Christina HoffmannChristina HoffmannOak Ridge National LaboratorySearch for other works by this author on:Published:15 December 2019
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Light Optical Micrography
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Light Optical MetallographyByGeorge F. Vander VoortGeorge F. Vander VoortVander Voort Consulting L.L.C.Search for other works by this author on:Published:15 December 2019
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Quantitative MetallographyByGeorge F. Vander VoortGeorge F. Vander VoortVander Voort Consulting L.L.C.Search for other works by this author on:Published:15 December 2019
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Microscopy and Microanalysis
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Scanning Electron MicroscopyByYoosuf N. PicardYoosuf N. PicardCarnegie Mellon UniversitySearch for other works by this author on:Published:15 December 2019
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Crystallographic Analysis by Electron Backscatter Diffraction in the Scanning Electron MicroscopeByJoseph R. MichaelJoseph R. MichaelSandia National LaboratoriesSearch for other works by this author on:Published:15 December 2019
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Transmission Electron MicroscopyByMasashi WatanabeMasashi WatanabeLehigh UniversitySearch for other works by this author on:Published:15 December 2019
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Electron Probe X-Ray MicroanalysisByDale E. Newbury;Dale E. NewburyNational Institute of Standards and TechnologySearch for other works by this author on:Nicholas W. M. RitchieNicholas W. M. RitchieNational Institute of Standards and TechnologySearch for other works by this author on:Published:15 December 2019
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Focused Ion Beam InstrumentsPublished:15 December 2019
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Surface Analysis
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Auger Electron SpectroscopyPublished:15 December 2019
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Low-Energy Electron DiffractionByAmirali ZangiabadiAmirali ZangiabadiColumbia University
Revising author
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Introduction to Scanning Probe MicroscopyByBharat BhushanBharat BhushanThe Ohio State UniversitySearch for other works by this author on:Published:15 December 2019
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X-Ray Photoelectron Spectroscopy[1]ByBinayak PandaBinayak PandaNASA Marshall Space Flight CenterSearch for other works by this author on:Published:15 December 2019
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Thermal Desorption SpectroscopyByPaul J. ShillerPaul J. ShillerThe University of AkronSearch for other works by this author on:Published:15 December 2019
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Reference Information