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wavelength-dispersive X-ray fluorescence spectroscopy

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Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... on the operating principles and applications of detectors for x-ray spectroscopy, namely energy-dispersive spectrometers, wavelength-dispersive spectrometers, and handheld x-ray fluorescence systems. The processes involved in x-ray analysis in the SEM and handheld x-ray fluorescence analysis are then covered...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... maintenance, including assurance that adequate calibrations have been upheld. Methods such as x-ray fluorescence (XRF), arc or spark optical emission spectroscopy (OES), and inductively coupled plasma OES (ICP-OES) can be considered quantitative methods. To obtain optimal quantitative results, the sample...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006766
EISBN: 978-1-62708-295-2
.... If this information is not available, rapid, nondestructive, semiquantitative techniques such as energy-dispersive x-ray spectroscopy (EDS) and portable x-ray fluorescence (XRF) tools can be used to estimate the material composition in order to allow the chemical analyst to determine the proper techniques...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
...-dispersive x-ray spectra of a multicomponent glass. Source: Ref 5 The detection limits of EPMA using a wavelength-dispersive spectrometer are on the order of 0.01 wt%, an order of magnitude greater than is obtained using an energy-dispersive spectrometer. Auger Electron Spectroscopy In AES...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006757
EISBN: 978-1-62708-295-2
... Transmission electron microscopy (TEM) Polymer morphology X-ray photoelectron spectroscopy (XPS) Elemental concentrations, oxidation states Auger electron spectroscopy (AES) Elemental concentrations Wavelength dispersive x-ray analysis Elements present on polymer surfaces Source: Ref 7...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006782
EISBN: 978-1-62708-295-2
... technique for quantitative elemental analysis, comparing it to a standard solution, and the argon plasma-excitation source is used to generate a signal at the analytical wavelength for each element. The accuracy of the analysis is 0.01 wt% of the measured value. X-ray fluorescence spectroscopy...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003520
EISBN: 978-1-62708-180-1
..., X-ray techniques, and simulations. It also describes the steps for analyzing the data, preparing the report, preservation of evidence, and follow-up on recommendations. background data assembling chemical analysis electron microprobe analysis electron microscopy failure analysis...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003524
EISBN: 978-1-62708-180-1
... magnifications attainable, typically 5000 to 10,000×. In addition, SEMs are often equipped with microanalytical capabilities, for example, energy-dispersive x-ray spectroscopes (EDS). Chemical analysis can be helpful in confirming...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006785
EISBN: 978-1-62708-295-2
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003508
EISBN: 978-1-62708-180-1
... by more than the percentage of cross-sectional area that is caused by the macroporosity. Dynamic properties are also affected. A study of aluminum alloys showed that fatigue properties in some were reduced 11% when specimens having x-ray quality equivalent to ASTM E 155 level 4 were tested...
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.9781627083294
EISBN: 978-1-62708-329-4