1-10 of 10 Search Results for

volatile organic compound emission

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006825
EISBN: 978-1-62708-329-4
... of the tube at the failure location. As a result of the compounded effect of these changes, the tube could no longer sustain the internal pressure and finally failed by way of thick-lip rupture. The failure of the tube in the form of longitudinal rupture opening was due to long-term overheating. Thin...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003524
EISBN: 978-1-62708-180-1
... records, and pertinent purchase specifications. Additional information on upfront planning of investigations is also described in the article “Organization of a Failure Investigation” in this Volume. Collecting Data and Samples On-Site Investigation In the investigation of failures, it is also...
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006827
EISBN: 978-1-62708-329-4
... the solder joint. Most of the volatile chemical compounds in the solder paste evolve during the flux activation period; thus, the flux activation time must be sufficient for this evolution to happen. The IPC-A-610G standard defines a maximum allowable void rate of 30% projection area under x-ray observation...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... small area analysis, imaging Ease of use, quantification Chemical and molecular analysis, imaging Limitations Insulator analysis challenging, damaging to organics Very few Quantification difficult Major applications Semiconductors, electronics, metallurgy All industries Polymers...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... in order to get a disk large enough to analyze by the faster and thus more economical test methods, such as optical emission spectroscopy (OES) or glow discharge spectroscopy. As long as the chips or bits that are remelted are truly representative of the base metal (i.e., plating or other surface coating...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003525
EISBN: 978-1-62708-180-1
... with a chemical agent, is one of the leading causes of plastic failure. The chemical agent responsible for the cracking may be identified using FTIR. However, given that such materials are often volatile organic solvents, the chemical may not be present within the sample at the time of the analysis. Examples 2...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006787
EISBN: 978-1-62708-295-2
..., including metallographic mounting compounds. Micrograph shows an area approximately 6 mm (0.250 in.) wide. Courtesy of M. Chaudhari, Columbus Metallurgical Services Fig. 8 Sulfidation and chloridation attack on IN-601 nickel-base alloy of charcoal-regeneration kiln at higher magnification (~44...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006792
EISBN: 978-1-62708-295-2
... T.A. , A New Fatigue Life Model for Rolling Bearings , J. Tribol. , Vol 107 ( No. 3 ), 1985 , p 367 – 377 10.1115/1.3261081 11. “ Rolling Bearings—Dynamic Load Ratings and Rating Life ,” ISO 281, International Organization for Standardization , 2007 12. Zaretsky E.V...
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006834
EISBN: 978-1-62708-329-4
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.9781627083294
EISBN: 978-1-62708-329-4