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time-of-flight secondary ion mass spectrometry

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Published: 15 January 2021
Fig. 8 Time-of-flight secondary ion mass spectrometry total positive ion mass spectrum of polyethylene terephthalate More
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Published: 01 January 2002
Fig. 16 Time-of-flight secondary ion mass spectrometry spectrum showing mass separation of Cu and C 5 H 3 peaks, both at a nominal mass of 63 More
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Published: 01 January 2002
Fig. 8 Time-of-flight secondary ion mass spectrometry positive ion spectrum of stainless steel surface More
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Published: 01 January 2002
Fig. 15 Time-of-flight secondary ion mass spectrometry negative ion spectrum of stainless steel surface. Postive ion spectrum is in Fig. 8 . More
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Published: 15 January 2021
Fig. 9 Time-of-flight secondary ion mass spectrometry total positive ion spectrum of polypropylene surface showing unexpected peaks at 304 and 481 Daltons More
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Published: 15 January 2021
Fig. 10 Time-of-flight secondary ion mass spectrometry total ion image of polypropylene surface with suspected contamination present More
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Published: 01 January 2002
Fig. 17 Time-of-flight secondary ion mass spectrometry images of 50 by 50 μm stainless steel surface area. (a) Map of Cr (b) Map of Fe, (c) Map of Na More
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Published: 15 January 2021
Fig. 15 Time-of-flight secondary ion mass spectrometry spectra showing MS 2 spectra for mass-to-charge ( m / z ) ratios of 304 and 481 precursor ions More
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Published: 15 January 2021
Fig. 16 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) MS 2 spectrum at 304 compared to National Institute of Standards and Technology (NIST) database spectrum for benzalkonium, a polymer additive More
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Published: 15 January 2021
Fig. 17 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) MS 2 spectrum at 481 compared to National Institute of Standards and Technology (NIST) database spectrum for Tinuvin 770, a polymer additive More
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Published: 15 January 2021
Fig. 18 Time-of-flight secondary ion mass spectrometry spectra for polypropylene (PP) and peaks at 304 and 481 Daltons, and ion maps corresponding to these peaks More
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... Abstract This article provides information on the chemical characterization of surfaces by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). It describes the basic theory behind each of these techniques...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... Abstract This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more important...
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Published: 15 May 2022
Fig. 63 Schematic diagrams. (a) Reflection time-of-flight secondary ion mass spectrometry (ToF-SIMS) system. Courtesy of ION-TOF GmbH, Munster, Germany. (b) TRIFT ToF-SIMS system. SED, secondary electron detector. Courtesy of Physical Electronics Inc., Chanhassen, MN More
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Published: 15 May 2022
Fig. 1 Depth of analysis, depth of profiling, and length scale presentation in surface examination and analysis of polymers. AFM, atomic force microscopy; SEM, scanning electron microscopy; XPS, x-ray photoelectron spectroscopy; ToF-SIMS, time-of-flight secondary ion mass spectrometry; EDS More
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006943
EISBN: 978-1-62708-395-9
... be used for conductive materials, while XPS can be used to study both conductive and nonconductive materials such as polymers. Another surface chemical analysis technique is time-of-flight secondary ion mass spectrometry (ToF-SIMS), which complements XPS analysis. The ToF-SIMS technique has a typical...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.9781627083959
EISBN: 978-1-62708-395-9
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003524
EISBN: 978-1-62708-180-1
..., and/or wear conditions are being investigated. In an analysis of a fracture, the following steps are described: Selection, identification, preservation, and/or cleaning of critical specimens Macroscopic examination and analysis (fracture surfaces, secondary cracks, and other surface phenomena...
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006812
EISBN: 978-1-62708-329-4
... are typical for these base materials. Further detailed NDE was carried out using advanced UT, that is, phased-array UT and time-of-flight diffraction, and all defects (many new that were undetected by RT) were repaired in accordance with the ASME Section...