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Search Results for time-of-flight secondary ion mass spectrometry
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Published: 15 January 2021
Fig. 8 Time-of-flight secondary ion mass spectrometry total positive ion mass spectrum of polyethylene terephthalate
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Published: 01 January 2002
Fig. 16 Time-of-flight secondary ion mass spectrometry spectrum showing mass separation of Cu and C 5 H 3 peaks, both at a nominal mass of 63
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Published: 01 January 2002
Fig. 8 Time-of-flight secondary ion mass spectrometry positive ion spectrum of stainless steel surface
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Published: 01 January 2002
Fig. 15 Time-of-flight secondary ion mass spectrometry negative ion spectrum of stainless steel surface. Postive ion spectrum is in Fig. 8 .
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Published: 15 January 2021
Fig. 9 Time-of-flight secondary ion mass spectrometry total positive ion spectrum of polypropylene surface showing unexpected peaks at 304 and 481 Daltons
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Published: 15 January 2021
Fig. 10 Time-of-flight secondary ion mass spectrometry total ion image of polypropylene surface with suspected contamination present
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Published: 01 January 2002
Fig. 17 Time-of-flight secondary ion mass spectrometry images of 50 by 50 μm stainless steel surface area. (a) Map of Cr (b) Map of Fe, (c) Map of Na
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Published: 15 January 2021
Fig. 15 Time-of-flight secondary ion mass spectrometry spectra showing MS 2 spectra for mass-to-charge ( m / z ) ratios of 304 and 481 precursor ions
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Published: 15 January 2021
Fig. 16 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) MS 2 spectrum at 304 compared to National Institute of Standards and Technology (NIST) database spectrum for benzalkonium, a polymer additive
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Published: 15 January 2021
Fig. 17 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) MS 2 spectrum at 481 compared to National Institute of Standards and Technology (NIST) database spectrum for Tinuvin 770, a polymer additive
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Published: 15 January 2021
Fig. 18 Time-of-flight secondary ion mass spectrometry spectra for polypropylene (PP) and peaks at 304 and 481 Daltons, and ion maps corresponding to these peaks
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Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... Abstract This article provides information on the chemical characterization of surfaces by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). It describes the basic theory behind each of these techniques...
Abstract
This article provides information on the chemical characterization of surfaces by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). It describes the basic theory behind each of these techniques, the types of data produced from each, and some typical applications. The article explains the strengths of AES, XPS, and TOF-SIMS based on data obtained from the surface of a slightly corroded stainless steel sheet.
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... Abstract This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more important...
Abstract
This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more important attributes are listed for preliminary insight into the strengths and limitations of these techniques for chemical characterization of surfaces. The article describes the basic theory behind each of the different techniques, the types of data produced from each, and some typical applications. Also discussed are the different types of samples that can be analyzed and the special sample-handling procedures that must be implemented when preparing to do failure analysis using these surface-sensitive techniques. Data obtained from different material defects are presented for each of the techniques. The examples presented highlight the typical data sets and strengths of each technique.
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Published: 15 May 2022
Fig. 63 Schematic diagrams. (a) Reflection time-of-flight secondary ion mass spectrometry (ToF-SIMS) system. Courtesy of ION-TOF GmbH, Munster, Germany. (b) TRIFT ToF-SIMS system. SED, secondary electron detector. Courtesy of Physical Electronics Inc., Chanhassen, MN
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Published: 15 May 2022
Fig. 1 Depth of analysis, depth of profiling, and length scale presentation in surface examination and analysis of polymers. AFM, atomic force microscopy; SEM, scanning electron microscopy; XPS, x-ray photoelectron spectroscopy; ToF-SIMS, time-of-flight secondary ion mass spectrometry; EDS
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Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006943
EISBN: 978-1-62708-395-9
... be used for conductive materials, while XPS can be used to study both conductive and nonconductive materials such as polymers. Another surface chemical analysis technique is time-of-flight secondary ion mass spectrometry (ToF-SIMS), which complements XPS analysis. The ToF-SIMS technique has a typical...
Abstract
This article discusses the operating principles, advantages, and limitations of scanning electron microscopy, atomic force microscopy, x-ray photoelectron spectroscopy, and secondary ion mass spectroscopy that are used to analyze the surface chemistry of plastics.
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.9781627083959
EISBN: 978-1-62708-395-9
Book Chapter
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003524
EISBN: 978-1-62708-180-1
..., and/or wear conditions are being investigated. In an analysis of a fracture, the following steps are described: Selection, identification, preservation, and/or cleaning of critical specimens Macroscopic examination and analysis (fracture surfaces, secondary cracks, and other surface phenomena...
Abstract
This article describes the preliminary stages and general procedures, techniques, and precautions employed in the investigation and analysis of metallurgical failures that occur in service. The most common causes of failure characteristics are described for fracture, corrosion, and wear failures. The article provides information on the synthesis and interpretation of results from the investigation. Finally, it presents key guidelines for conducting a failure analysis.
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006812
EISBN: 978-1-62708-329-4
... are typical for these base materials. Further detailed NDE was carried out using advanced UT, that is, phased-array UT and time-of-flight diffraction, and all defects (many new that were undetected by RT) were repaired in accordance with the ASME Section...
Abstract
This article discusses pressure vessels, piping, and associated pressure-boundary items of the types used in nuclear and conventional power plants, refineries, and chemical-processing plants. It begins by explaining the necessity of conducting a failure analysis, followed by the objectives of a failure analysis. Then, the article discusses the processes involved in failure analysis, including codes and standards. Next, fabrication flaws that can develop into failures of in-service pressure vessels and piping are covered. This is followed by sections discussing in-service mechanical and metallurgical failures, environment-assisted cracking failures, and other damage mechanisms that induce cracking failures. Finally, the article provides information on inspection practices.