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time-of-flight secondary ion mass spectrometry

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Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
...: EDS, energy-dispersive spectroscopy; WDS, wavelength-dispersive spectroscopy; AES, Auger electron spectroscopy; XPS, x-ray photoelectron spectroscopy; TOF-SIMS, time-of-flight secondary ion mass spectrometry; FTIR, Fourier transform infrared (spectroscopy) Auger electron spectroscopy atomic...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... of stainless steel surface with corrosion present Fig. 7 X-ray photoelectron spectroscopy depth profiling using monoatomic argon sputtering through the oxide of a stainless steel surface Fig. 9 Time-of-flight secondary ion mass spectrometry total positive ion spectrum of polypropylene...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003524
EISBN: 978-1-62708-180-1
... of an acetate replica, and a setup time of several hours is required. However, the added area can be very important in an investigation. Hardness testing with a portable hardness testing instrument also may be performed during on-site failure analysis. Several different types of testers are available...