1-6 of 6 Search Results for

thermal desorption spectroscopy

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006924
EISBN: 978-1-62708-395-9
... of thermal degradation. Thermogravimetric analysis is also used to determine filler loading, as discussed later in this section. One application of TGA is to study the desorption and adsorption of moisture in a cured thermoset matrix. Figure 44 shows the percent mass as a function of time for a moisture...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... specified relative to a known sputter rate on a reference material, such as thermally grown SiO 2 on single-crystal silicon. Fig. 6 X-ray photoelectron spectroscopy compositional depth profile of stainless steel Angle-Dependent Analysis Angle-dependent XPS is a method for nondestructively...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... Abstract This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more important...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006943
EISBN: 978-1-62708-395-9
... >$20,000 Sample preparation No Yes No General features of time-of-flight secondary ion mass spectrometry (ToF-SIMS) and x-ray photoelectron spectroscopy (XPS) Table 3 General features of time-of-flight secondary ion mass spectrometry (ToF-SIMS) and x-ray photoelectron spectroscopy (XPS...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.9781627083959
EISBN: 978-1-62708-395-9
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006917
EISBN: 978-1-62708-395-9
... FTIR, there are two basic analysis strategies. The plastic sample can be heated, and the evolved gases can be concentrated and then passed through the instrumentation for analysis. The most common techniques employed for such analyses are thermal desorption and headspace GC-MS. Alternately, the plastic...