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thermal desorption spectroscopy
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Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006924
EISBN: 978-1-62708-395-9
... of thermal degradation. Thermogravimetric analysis is also used to determine filler loading, as discussed later in this section. One application of TGA is to study the desorption and adsorption of moisture in a cured thermoset matrix. Figure 44 shows the percent mass as a function of time for a moisture...
Abstract
This article discusses the most common thermal analysis methods for thermosetting resins. These include differential scanning calorimetry, thermomechanical analysis, thermogravimetric analysis, and dynamic mechanical analysis. The article also discusses the characterization of uncured thermosetting resins as well as the curing process. Then, the techniques to characterize the physical properties of cured thermosets and composites are presented. Several examples of stress-strain curves are shown for thermosets and thermoplastic polymers.
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... specified relative to a known sputter rate on a reference material, such as thermally grown SiO 2 on single-crystal silicon. Fig. 6 X-ray photoelectron spectroscopy compositional depth profile of stainless steel Angle-Dependent Analysis Angle-dependent XPS is a method for nondestructively...
Abstract
This article provides information on the chemical characterization of surfaces by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). It describes the basic theory behind each of these techniques, the types of data produced from each, and some typical applications. The article explains the strengths of AES, XPS, and TOF-SIMS based on data obtained from the surface of a slightly corroded stainless steel sheet.
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... Abstract This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more important...
Abstract
This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more important attributes are listed for preliminary insight into the strengths and limitations of these techniques for chemical characterization of surfaces. The article describes the basic theory behind each of the different techniques, the types of data produced from each, and some typical applications. Also discussed are the different types of samples that can be analyzed and the special sample-handling procedures that must be implemented when preparing to do failure analysis using these surface-sensitive techniques. Data obtained from different material defects are presented for each of the techniques. The examples presented highlight the typical data sets and strengths of each technique.
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006943
EISBN: 978-1-62708-395-9
... >$20,000 Sample preparation No Yes No General features of time-of-flight secondary ion mass spectrometry (ToF-SIMS) and x-ray photoelectron spectroscopy (XPS) Table 3 General features of time-of-flight secondary ion mass spectrometry (ToF-SIMS) and x-ray photoelectron spectroscopy (XPS...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.9781627083959
EISBN: 978-1-62708-395-9
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006917
EISBN: 978-1-62708-395-9
... FTIR, there are two basic analysis strategies. The plastic sample can be heated, and the evolved gases can be concentrated and then passed through the instrumentation for analysis. The most common techniques employed for such analyses are thermal desorption and headspace GC-MS. Alternately, the plastic...
Abstract
While there are many fracture mechanisms that can lead to the failure of a plastic component, environmental stress cracking (ESC) is recognized as one of the leading causes of plastic failure. This article focuses on unpacking the basic concepts of ESC to provide the engineer with a better understanding of how to evaluate and prevent it. It then presents factors that affect and contribute to the susceptibility of plastic to ESC: material factors, chemical factors, stress, and environmental factors. The article includes the collection of background information to understand the circumstances surrounding the failure, a fractographic evaluation to assess the cracking, and analytical testing to evaluate the material, design, manufacturing, and environmental factors.