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Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... small area analysis, imaging Ease of use, quantification Chemical and molecular analysis, imaging Limitations Insulator analysis challenging, damaging to organics Very few Quantification difficult Major applications Semiconductors, electronics, metallurgy All industries Polymers...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
.... With the advent of semiconductor devices, a new type of detector was developed that, with no moving parts, could simultaneously count and determine the energy of the x-rays ( Fig. 6 ). These detectors are the ones used for EDS modules on SEM devices. If small peaks are being sought while additional elements...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
..., imaging Limitations Semiconductive Very few Quantification difficult Major applications Semiconductors, electronics All industries Polymers, contamination, trace metal analysis Evaluation techniques for chemical characterization of surfaces Table 1 Evaluation techniques for chemical...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006766
EISBN: 978-1-62708-295-2
... and qualitative determination of primary and trace elemental constituents in metal alloys. Optical emission spectroscopy is also used for a variety of other analyses, including: Fast elemental depth profiling of technical coatings Determination of trace impurity concentrations in semiconductor materials...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
.... The development of handheld x-ray fluorescence (XRF) instruments that allow quantitative x-ray analyses to be carried out on bulk samples in air has been a major innovation for field work. The XRF units combine an x-ray-generation source and an x-ray detector into a single device that is small, lightweight...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... (sometimes referred to as a reflected electron image). Figure 8 shows a fracture surface for a titanium alloy implantable medical device where the fracture radial ridges that mark a fracture origin location are much more readily visible in the reflected electron image than in the secondary electron imaging...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006764
EISBN: 978-1-62708-295-2
... ( No. 3 ), 2018 , p 554 – 561 10.1007/s11668-018-0440-6 37. Mikolajczak C.J. , Hayes T. , Megerle M.V. , and Wu M. , A Scientific Methodology for Investigation of a Lithium Ion Battery Failure , 2007 IEEE International Conference on Portable Information Devices , IEEE...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.9781627082952
EISBN: 978-1-62708-295-2
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... voltage. Figure 21 shows a defect area in an anodized coating on a titanium component for a medical device. Using light microscopy, a small white spot was visible on the blue anodized coating. With the SEM at 20 keV, the spot was barely detectable. The defect area was easily characterized as a void...