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secondary ion mass spectroscopy

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Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003522
EISBN: 978-1-62708-180-1
..., Auger electron spectroscopy, secondary ion mass spectroscopy, and X-ray powder diffraction. The article discusses the analysis and interpretation of base material composition and microstructures. Preparation and examination of metallographic specimens in failure analysis are also discussed. The article...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.process.c9001629
EISBN: 978-1-62708-235-8
... and discolored areas both showed trace amounts of residue in the form of adherent deposits. EDS, FTIR spectroscopy, XPS, and secondary ion mass spectroscopy (SIMS) analyses indicated that the discoloration to the copper components was due to the development of CuO at localized regions. It was recommended...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006943
EISBN: 978-1-62708-395-9
... >$20,000 Sample preparation No Yes No General features of time-of-flight secondary ion mass spectrometry (ToF-SIMS) and x-ray photoelectron spectroscopy (XPS) Table 3 General features of time-of-flight secondary ion mass spectrometry (ToF-SIMS) and x-ray photoelectron spectroscopy (XPS...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.9781627081801
EISBN: 978-1-62708-180-1
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0006548
EISBN: 978-1-62708-180-1
... SIMS secondary ion mass spectroscopy SLC sustained load cracking SMAW shielded metal arc welding SMIE solid metal induced embrittlement S-N stress-number of cycles SRB sulfate-reducing bacteria SSC sulfide-stress cracking tc critical thickness T thickness T throat T temperature Tc recrystallization...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... Abstract This article provides information on the chemical characterization of surfaces by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). It describes the basic theory behind each of these techniques...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006945
EISBN: 978-1-62708-395-9
...-styrene size-exclusion chromatography scanning electron microscope short ber reinforced polymer secondary ion mass spectroscopy styrene-maleic anhydride sheet molding compound Society of Plastics Engineers superplastic forming structural reaction injection molding scanning transmission electron...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... Abstract This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more important...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006757
EISBN: 978-1-62708-295-2
.... The more common ones, which are described briefly in this section, are x-ray analysis by energy-dispersive spectroscopy (EDS), electron probe microanalysis (EPMA), Auger electron spectroscopy (AES), secondary ion mass spectroscopy (SIMS), and x-ray powder diffraction (XRPD). Energy-Dispersive X-Ray...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.9781627083959
EISBN: 978-1-62708-395-9
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006924
EISBN: 978-1-62708-395-9
... Fig. 19 Idealized thermomechanical analysis curve in the expansion mode. α, coefficient of thermal expansion; T g , glass transition temperature. Source: Ref 7 Fig. 20 Percent mass loss as a function of temperature for an ink used in screen printing at 5 °C/min (9 °F/min) in air. Source...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006933
EISBN: 978-1-62708-395-9
..., carbon content, chemical composition, and copolymer structure ( Ref 11 ). Additionally, surface analysis spectroscopic techniques, such as secondary ion mass spectroscopy, x-ray photoelectron spectroscopy, and electron spectroscopy for chemical analysis, are specifically used to characterize very shallow...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006931
EISBN: 978-1-62708-395-9
... Chemical shift of nuclei Molecular structure, functional group determination, sequence distribution Mass spectroscopy Mass/charge of ions produced Molecular structure X-ray diffraction analysis (XRD) Crystalline polymer component Crystalline structure, short- and long-range ordering, percent...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003525
EISBN: 978-1-62708-180-1
..., such as secondary ion mass spectroscopy, x-ray photoelectron spectroscopy, and electron spectroscopy for chemical analysis, are specifically used to characterize very shallow surface layers. These techniques can be used to analyze material composition but are particularly suited for the analysis of surface...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006917
EISBN: 978-1-62708-395-9
... techniques, including energy-dispersive x-ray spectroscopy, ion chromatography, inductively coupled plasma/optical emission spectroscopy, x-ray photoelectron spectroscopy, and time-of-flight/secondary ion mass spectroscopy, may also be employed to analyze a plastic sample for chemical agents. Their use...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001812
EISBN: 978-1-62708-241-9
...-metal films can, however, be detected using surface-sensitive techniques such as Auger-Electron Spectroscopy or Secondary-Ion Mass Spectroscopy. For SMIE from internal sources of embrittling metal, particles may be apparent on metallographic sections, and their identity can be determined by EDS...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006783
EISBN: 978-1-62708-295-2
... (emf) series is a table that lists in order the standard electrode potentials of specified electrochemical reactions. The potentials are measured against a standard reference electrode when the metal is immersed in a solution of its own ions at unit activity ( Table 1 ). Similar to the galvanic series...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001775
EISBN: 978-1-62708-241-9
... with ASTM B 366 Specification Composition, mass % Ni Cu Fe Mn C Si S Tube 62.94 33.20 2.31 1.05 0.13 0.16 <0.01 ASTM B 366 min 63 28–34 max 2.50 max 2.0 max 0.3 max 0.5 max 0.024 Fig. 10 SEM micrograph showing intergranular crack propagation as well...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006939
EISBN: 978-1-62708-395-9
... antimicrobial compounds Type Details Application ZnO in polybutylene succinate films Composite films were prepared by blown-film extrusion at five ZnO levels, ranging from 2 to 10 wt%. Minimum loading of 6 wt% was needed to achieve antimicrobial effect. Zinc ions were released over 15 days...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003556
EISBN: 978-1-62708-180-1
..., electrons released by the oxidation of metals are used directly in microbial metabolism. In other cases, it is the chemicals and conditions created by microbial activity that promote MIC. Secondary effects can also be important. These include such things as the biodegradation of lubricants and protective...