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scanning transmission electron microscopy

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Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006945
EISBN: 978-1-62708-395-9
...-styrene size-exclusion chromatography scanning electron microscope short ber reinforced polymer secondary ion mass spectroscopy styrene-maleic anhydride sheet molding compound Society of Plastics Engineers superplastic forming structural reaction injection molding scanning transmission electron...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.steel.c9001490
EISBN: 978-1-62708-232-7
... Abstract A steel pot used as crucible in a magnesium alloy foundry developed a leak that resulted in a fire and caused extensive damage. Hypotheses as to the cause of the leak included a defect in the pot, overuse, overheating, and poor foundry practices. Scanning electron microscopy...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.modes.c9001681
EISBN: 978-1-62708-234-1
...). To assist in this procedure, a microstructural analysis was made of the cast components. This involved optical microscopy (OM), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM). IN SEM and STEM, microchemical analyses were...
Series: ASM Failure Analysis Case Histories
Volume: 1
Publisher: ASM International
Published: 01 December 1992
DOI: 10.31399/asm.fach.v01.c9001125
EISBN: 978-1-62708-214-3
... Scanning Electron Microscopy/Fractography Testing Procedure and Results Surface Examination Macrofractography Corrosion Morphology Metallography Microstructural Analysis Discussion The aluminum connector failed by ductile fracture, which indicates mechanical overload rather than...
Series: ASM Failure Analysis Case Histories
Volume: 1
Publisher: ASM International
Published: 01 December 1992
DOI: 10.31399/asm.fach.v01.c9001124
EISBN: 978-1-62708-214-3
... Leading to Failure Pertinent Specifications Testing Procedure and Results Nondestructive Evaluation Liquid Penetrant Inspection Visual Examination of General Physical Features Surface Examination Scanning Electron Microscopy/Fractography Crack Origins/Paths Metallography...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.process.c0045918
EISBN: 978-1-62708-235-8
... cleaning procedures to remove any trace of the cleaning acids be used. Auger electron spectroscopy Contaminants Grain boundaries Rocket nozzles Scanning electron microscopy Nb-106 Stress-corrosion cracking Intergranular fracture Since electron microscopy for the evaluation of fracture...
Series: ASM Failure Analysis Case Histories
Volume: 1
Publisher: ASM International
Published: 01 December 1992
DOI: 10.31399/asm.fach.v01.c9001077
EISBN: 978-1-62708-214-3
.../Identification Material Metallography Microstructural Analysis Testing Procedure and Results Nondestructive Evaluation Magnetic Particle Inspection Surface Examination Stereomicroscopic Scanning Electron Microscopy/Fractography Scanning electron microscopy (SEM) examination...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003527
EISBN: 978-1-62708-180-1
... or sectioning for scanning electron microscopy examination and/or metallography. It is important to photograph the component at each stage of the process to retain the visual information available and the component condition at each step. Field Photographic Documentation Composition Photographic...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006943
EISBN: 978-1-62708-395-9
...-induced dissociation; SED, secondary electron detector; GCIB, gas cluster ion beam; FIB, focused ion beam; LMIG, liquid metal ion gun. Courtesy of Physical Electronics Inc., Chanhassen, MN Fig. 4 Nonconductive material imaged using (a) conventional scanning electron microscopy, (b) low-pressure...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006763
EISBN: 978-1-62708-295-2
...-dimensional Z -stack image of exemplar crankshaft fracture with light-emitting diode ring light illumination Scanning Electron Microscopy Scanning electron microscopy is used routinely in failure analysis for the examination of fracture surfaces and the recording of fracture features. Scanning...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001792
EISBN: 978-1-62708-241-9
... revealed that there was sharp step-down in diameter (see Fig. 1c ) of the shaft which acted as stress riser, i.e., notch, and initiated the fatigue cracks under rotational bending stress. Scanning electron microscopy on the fracture surface revealed “striations” (see Fig. 1e ) in the beach marked fatigue...
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001293
EISBN: 978-1-62708-215-0
... in Same or Similar Service Testing Procedures and Results Surface Examination Visual Metallography Microstructural Analysis Scanning Electron Microscopy/Fractography Chemical Analysis/Alloy Identification Material Mechanical Properties Hardness Hardness measurements...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001838
EISBN: 978-1-62708-241-9
... , 2006 , p 461 – 471 . 10.31399/asm.hb.v14b.a0005135 Introduction Hypotheses about Potential Metallurgical Root Causes Materials Testing Results Chemical Composition Mechanical Properties Focussed Ion Beam (FIB)/Transmission Electron Microscopy (TEM) Electron Probe Microanalysis...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0006548
EISBN: 978-1-62708-180-1
... submerged arc welding SC carbon saturation SCC stress-corrosion cracking SCE standard calomel electrode SCF stress concentration factor SE secondary electrons SEM scanning electron microscopy; second- ary electron microscopy SFRP short fiber reinforced polymer compos- ite S-L short transverse-longitudinal...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.9781627081801
EISBN: 978-1-62708-180-1
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006769
EISBN: 978-1-62708-295-2
... preparation scanning electron microscope scanning electron microscopy THE SCANNING ELECTRON MICROSCOPE (SEM) is one of the most versatile instruments for investigating the microscopic features of most solid materials. Compared to the light microscope, it expands the resolution range by more than 1...
Series: ASM Failure Analysis Case Histories
Volume: 2
Publisher: ASM International
Published: 01 December 1993
DOI: 10.31399/asm.fach.v02.c9001286
EISBN: 978-1-62708-215-0
... Examination Scanning Electron Microscopy/Fractography Pertinent Specifications Chemical Analysis/Identification Metallography Microstructural Analysis Visual Examination of General Physical Features New cast brake discs and new stamped brake discs appear similar to one another...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003533
EISBN: 978-1-62708-180-1
... and the transmission electron microscope. Compared to optical microscopy, the depth of focus, ranging from 1 μm at 10,000× to 2 mm (0.08 in.) at 10×, is larger by more than two orders of magnitude. Development of SEM Technology Development of what is now recognized as a scanning electron microscope was begun...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006776
EISBN: 978-1-62708-295-2
... to the overload area. Overall direction of crack growth in these scanning electron microscopy views is from lower left to upper right. Well-defined fatigue striations form in certain materials under appropriate stress ranges, particularly in metals with multiple active slip planes. For example, well...
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006822
EISBN: 978-1-62708-329-4
... damage are noted. Scanning electron microscopy (SEM) and energy-dispersive spectroscopy (EDS) showed that the fracture surface was largely covered with iron oxide and had very little actual fractured metal. The small areas of shiny metal exhibited gouging and were associated with handling damage...