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Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.aero.c9001560
EISBN: 978-1-62708-217-4
... were conducted. Powder x-ray diffraction was performed using a Rigaku/Geigerflex XRD system. For the microprobe analysis a Princeton Gammatech EDX system attached to an ETEC Autoscan electron microscope was used. Results CERT Constant extension rate tests performed in the inert environment...
Series: ASM Failure Analysis Case Histories
Publisher: ASM International
Published: 01 June 2019
DOI: 10.31399/asm.fach.aero.c9001600
EISBN: 978-1-62708-217-4
... in diameter were subsequently punched from this material, and electropolished in a 20% nitric-methanol electrolyte at −30 °C. The specimens were examined using a Philips CM-12 electron microscope fitted with a Princeton Gamma Technologies (PGT) Energy Dispersive Spectroscopy (EDS) system. Table 8 summarizes...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003519
EISBN: 978-1-62708-180-1
... the Failure Examination , Practical Failure Analysis , April 2001 , adapted and reprinted in this Volume • Schlager N. and Petroski H. , When Technology Fails , GNE Research, Inc. , 1994 • Kepner C.H. and Tregoe B. , The New Rational Manager , Princeton Research...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006755
EISBN: 978-1-62708-295-2
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006803
EISBN: 978-1-62708-329-4
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006923
EISBN: 978-1-62708-395-9