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photo spectrometry

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Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... Abstract This article provides information on the chemical characterization of surfaces by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). It describes the basic theory behind each of these techniques...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003529
EISBN: 978-1-62708-180-1
... and oxygen, with significantly lower atomic numbers than the aluminum (dark flakes) or the steel (bright flakes). The particles and fibers in both photos are held in place by a special double stick tape whose only EDS detectible element is carbon. Energy-Dispersive Spectrometry Microchemical Analysis...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001754
EISBN: 978-1-62708-241-9
... to the discovery of overlooked debris in an engine chip detector, and thus resulted in a review of several maintenance practices. aircraft bearings operating overload inadequate maintenance and inspection M50 alloy steel bulk deformation energy dispersive spectrometry chemical composition AMS 6490...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006939
EISBN: 978-1-62708-395-9
... are relevant to define the compatibility of a surface modifier prior to application. The SEM is often used to characterize the particle size. Focused ion beam cuts can provide further insight into the compatibility with the solid polymer matrix, whereas photo- or laser-analysis-based particle-size distribution...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003524
EISBN: 978-1-62708-180-1
... to enlarge a specific area in the photo, such as a crack or other small detail. A metallographic microscope with macroobjectives and lights may be used for somewhat higher magnifications. However, depth of field becomes extremely limited with light optics. For much greater depth of field, a SEM may be used...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006782
EISBN: 978-1-62708-295-2
...) spectrometry is faster and simpler compared with traditional IR spectroscopy and requires only a very small amount of sample for precise analysis. The IR spectra can be compared with databases of thousands of known polymers and additives. The IR and FTIR analyses are performed on a polymer for identification...
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.9781627083959
EISBN: 978-1-62708-395-9