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mass spectrometry

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Published: 01 January 2002
Fig. 16 Time-of-flight secondary ion mass spectrometry spectrum showing mass separation of Cu and C 5 H 3 peaks, both at a nominal mass of 63 More
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Published: 15 January 2021
Fig. 8 Time-of-flight secondary ion mass spectrometry total positive ion mass spectrum of polyethylene terephthalate More
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Published: 01 January 2002
Fig. 8 Time-of-flight secondary ion mass spectrometry positive ion spectrum of stainless steel surface More
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Published: 01 January 2002
Fig. 15 Time-of-flight secondary ion mass spectrometry negative ion spectrum of stainless steel surface. Postive ion spectrum is in Fig. 8 . More
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Published: 01 January 2002
Fig. 17 Time-of-flight secondary ion mass spectrometry images of 50 by 50 μm stainless steel surface area. (a) Map of Cr (b) Map of Fe, (c) Map of Na More
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Published: 15 January 2021
Fig. 9 Time-of-flight secondary ion mass spectrometry total positive ion spectrum of polypropylene surface showing unexpected peaks at 304 and 481 Daltons More
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Published: 15 January 2021
Fig. 10 Time-of-flight secondary ion mass spectrometry total ion image of polypropylene surface with suspected contamination present More
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Published: 15 January 2021
Fig. 15 Time-of-flight secondary ion mass spectrometry spectra showing MS 2 spectra for mass-to-charge ( m / z ) ratios of 304 and 481 precursor ions More
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Published: 15 January 2021
Fig. 16 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) MS 2 spectrum at 304 compared to National Institute of Standards and Technology (NIST) database spectrum for benzalkonium, a polymer additive More
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Published: 15 January 2021
Fig. 17 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) MS 2 spectrum at 481 compared to National Institute of Standards and Technology (NIST) database spectrum for Tinuvin 770, a polymer additive More
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Published: 15 January 2021
Fig. 18 Time-of-flight secondary ion mass spectrometry spectra for polypropylene (PP) and peaks at 304 and 481 Daltons, and ion maps corresponding to these peaks More
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003534
EISBN: 978-1-62708-180-1
... Abstract This article provides information on the chemical characterization of surfaces by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). It describes the basic theory behind each of these techniques...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006771
EISBN: 978-1-62708-295-2
... Abstract This article covers the three most popular techniques used to characterize the very outermost layers of solid surfaces: Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Some of the more important...
Series: ASM Failure Analysis Case Histories
Volume: 3
Publisher: ASM International
Published: 01 December 2019
DOI: 10.31399/asm.fach.v03.c9001826
EISBN: 978-1-62708-241-9
... testing, energy dispersive x-ray analysis, and inductively coupled plasma mass spectrometry. The tube was made from SA 210A1 carbon steel that had been compromised by wall thinning and the accumulation of fire and water-side scale deposits. Investigators determined that the tube failed due to prolonged...
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Published: 15 May 2022
Fig. 58 Ion impact removal of atoms or clusters from solid surfaces. Mass analysis of the sputtered particles is the basis of the static secondary ion mass spectrometry technique. Simultaneous x-ray photoelectron spectroscopy analysis of the bottom of the etch crater produces chemical depth More
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Published: 15 May 2022
Fig. 16 Characterization of a flame retardant in acrylonitrile-butadiene-styrene (ABS). (a) Fourier transform infrared analysis of a polymer with a flame retardant. (b) Gas chromatography/mass spectrometry analysis of a polymer extract. RT, retention time More
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Published: 15 May 2022
Fig. 63 Schematic diagrams. (a) Reflection time-of-flight secondary ion mass spectrometry (ToF-SIMS) system. Courtesy of ION-TOF GmbH, Munster, Germany. (b) TRIFT ToF-SIMS system. SED, secondary electron detector. Courtesy of Physical Electronics Inc., Chanhassen, MN More
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Published: 15 May 2022
Fig. 1 Depth of analysis, depth of profiling, and length scale presentation in surface examination and analysis of polymers. AFM, atomic force microscopy; SEM, scanning electron microscopy; XPS, x-ray photoelectron spectroscopy; ToF-SIMS, time-of-flight secondary ion mass spectrometry; EDS More
Series: ASM Handbook
Volume: 11B
Publisher: ASM International
Published: 15 May 2022
DOI: 10.31399/asm.hb.v11B.a0006945
EISBN: 978-1-62708-395-9
... microscopy time-controlled gain toluene diisocyanate tetraethylenetriamine glass transition temperature thermogravimetric analysis tetraglycidylmethylenedianiline thin-layer chromatography melting temperature thermomechanical analysis tetramethyl silane time-of- ight secondary ion mass spectrometry...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006766
EISBN: 978-1-62708-295-2
..., and the need for only a small amount of sample for analysis (10 to 500 mg). However, it is completely destructive for the analyzed sample. A similar technique, inductively coupled plasma mass spectrometry (ICP-MS), was developed for trace analysis, because it provides a significantly lower detection limit...