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handheld X-ray fluorescence analysis

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Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006770
EISBN: 978-1-62708-295-2
... on the operating principles and applications of detectors for x-ray spectroscopy, namely energy-dispersive spectrometers, wavelength-dispersive spectrometers, and handheld x-ray fluorescence systems. The processes involved in x-ray analysis in the SEM and handheld x-ray fluorescence analysis are then covered...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006759
EISBN: 978-1-62708-295-2
... maintenance, including assurance that adequate calibrations have been upheld. Methods such as x-ray fluorescence (XRF), arc or spark optical emission spectroscopy (OES), and inductively coupled plasma OES (ICP-OES) can be considered quantitative methods. To obtain optimal quantitative results, the sample...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003527
EISBN: 978-1-62708-180-1
... not benefit by color photography. The primary techniques of photography associated with scanning electron microscopy are digital photography and instant film photography. X-ray imaging spectroscopy associated with scanning electron microscopy typically uses digital photography for the recording of x-ray...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006763
EISBN: 978-1-62708-295-2
... is digital photography. The digital camera is incorporated in the scanning electron microscope. X-ray spectroscopy image photography may also be used for the recording of x-ray images and maps. Fig. 30 Setup for scanning electron microscopic examination of exemplar fractured crankshaft Fig. 31...
Series: ASM Handbook Archive
Volume: 11
Publisher: ASM International
Published: 01 January 2002
DOI: 10.31399/asm.hb.v11.a0003524
EISBN: 978-1-62708-180-1
... of electromagnetic inspection include: Depth of penetration is shallow. Materials to be inspected must be electrically conductive. Indications are influenced by more than one variable. Reference standards are required. Residual Stress Analysis X-ray diffraction is the most common method...
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.a0006822
EISBN: 978-1-62708-329-4
... the chemical composition of surface residue. Various techniques may be used, including energy-dispersive spectroscopy, x-ray diffraction, or gas chromatography/mass spectrometry. Where microbiologically influenced corrosion is suspected as a possible cause or contributor to a failure, deposit samples should...
Series: ASM Handbook
Volume: 11
Publisher: ASM International
Published: 15 January 2021
DOI: 10.31399/asm.hb.v11.a0006788
EISBN: 978-1-62708-295-2
... surface deposits using techniques such as x-ray diffraction (XRD), energy-dispersive x-ray analysis (EDX), and x-ray fluorescence (XRF) to discover corrosion products or even oxidants such as MnO 2 or elemental sulfur that can be matched to a known corrosion scenario. The turnaround time for this work...
Series: ASM Handbook
Volume: 11A
Publisher: ASM International
Published: 30 August 2021
DOI: 10.31399/asm.hb.v11A.9781627083294
EISBN: 978-1-62708-329-4